2.2 Ion Scattering Spectroscopies

2021 ◽  
Author(s):  
Takae Takeuchi ◽  
A. James McQuillan ◽  
Alexander Shard ◽  
Andrea E. Russell ◽  
D. Brynn Hibbert
Keyword(s):  
1990 ◽  
Vol 44 (4) ◽  
pp. 255-258 ◽  
Author(s):  
S. Priggemeyer ◽  
A. Brockmeyer ◽  
H. Dötsch ◽  
H. Koschmieder ◽  
D.J. O'Connor ◽  
...  

1990 ◽  
Vol 237 (1) ◽  
pp. 19-23 ◽  
Author(s):  
B.T. Kim ◽  
M. Naito ◽  
T. Udagawa

1988 ◽  
Vol 19 (5) ◽  
pp. 1372-1374 ◽  
Author(s):  
P. P. Pronko ◽  
R. S. Bhattacharya ◽  
J. J. Kleek ◽  
F. H. Froes

1985 ◽  
Vol 441 (2) ◽  
pp. 381-396 ◽  
Author(s):  
R. Wolf ◽  
O. Tanimura ◽  
R. Kaps ◽  
U. Mosel

1981 ◽  
Vol 23 (3) ◽  
pp. 1561-1561
Author(s):  
Nasser Maleki ◽  
Joseph Macek

1999 ◽  
Vol 71 (16) ◽  
pp. 3311-3317 ◽  
Author(s):  
T. Pradeep ◽  
Jianwei Shen ◽  
Chris Evans ◽  
R. G. Cooks
Keyword(s):  

2000 ◽  
Vol 183-185 ◽  
pp. 207-214 ◽  
Author(s):  
Takayuki Kobayashi ◽  
C.F. McConville ◽  
J. Nakamura ◽  
G. Dorenbos ◽  
H. Sone ◽  
...  

1990 ◽  
Vol 202 ◽  
Author(s):  
J. Vrijmoeth ◽  
P.M. Zagwijn ◽  
J.W.M. Frenken ◽  
J.F. van der Veen

ABSTRACTThe surface structure of epitaxial NiSi2 films grown on Si (111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the NiSi2 (111) surface are resolved.The topology of the NiSi2 (111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.


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