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C.F. McConville ◽  
J. Nakamura ◽  
G. Dorenbos ◽  
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Metrologia ◽  
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Vol 57 (2) ◽  
pp. 025001 ◽  
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Tae Gun Kim ◽  
Ji-Hwan Kwon ◽  
Hyun Ruh ◽  
Kyungsu Park ◽  
...  
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Medium Energy ◽  
Ion Scattering ◽  
Ion Scattering Spectroscopy ◽  
Medium Energy Ion Scattering

Identification of donor deactivation centers in heavily As-doped Si using time-of-flight medium-energy ion scattering spectroscopy

2015 ◽  
Vol 118 (13) ◽  
pp. 135706 ◽  
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Kyungsu Park ◽  
Kyu-Sang Yu ◽  
Sungjung Joo ◽  
Yong-Sung Kim ◽  
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Keyword(s):  
Time Of Flight ◽  
Medium Energy ◽  
Ion Scattering ◽  
Ion Scattering Spectroscopy ◽  
Medium Energy Ion Scattering

Rumpled relaxation of TiC(001) and TaC(001) determined by high-resolution medium-energy ion scattering spectroscopy

2000 ◽  
Vol 61 (3) ◽  
pp. 1748-1751 ◽  
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Tomoaki Nishimura ◽  
Yasushi Hoshino ◽  
Shigeki Otani ◽  
Ryutaro Souda
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Vol 39 (Part 1, No. 7B) ◽  
pp. 4421-4424 ◽  
Author(s):  
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Hiroki Hibino ◽  
Yoshikazu Homma ◽  
Toshio Ogino
Keyword(s):  
Surface Melting ◽  
Medium Energy ◽  
Ion Scattering ◽  
Ion Scattering Spectroscopy ◽  
Medium Energy Ion Scattering

scholarly journals Quantitative Analysis of Calcium Phosphate Nanocluster Growth Using Time-of-Flight Medium-Energy-Ion-Scattering Spectroscopy

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Ki Dong Yang ◽  
Na-Young Kim ◽  
Kang-Won Jung ◽  
Viet-Duc Le ◽  
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Calcium Phosphate ◽  
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Medium Energy ◽  
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Ion Scattering Spectroscopy ◽  
Medium Energy Ion Scattering

Damage profiling of Ar+ sputtered Si(100) surface by medium energy ion scattering spectroscopy

1996 ◽  
Vol 100-101 ◽  
pp. 97-101 ◽  
Author(s):  
J.C. Lee ◽  
C.S. Jeong ◽  
H.J. Kang ◽  
H.K. Kim ◽  
D.W. Moon
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Ion Scattering ◽  
Ion Scattering Spectroscopy ◽  
Medium Energy Ion Scattering
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