Structure Determination of the Nisi2(111) Surface Using Medium Energy Ion Scattering with Monolayer Resolution

1990 ◽  
Vol 202 ◽  
Author(s):  
J. Vrijmoeth ◽  
P.M. Zagwijn ◽  
J.W.M. Frenken ◽  
J.F. van der Veen
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
New Method ◽  
Medium Energy ◽  
Ion Scattering ◽  
Triple Layer ◽  
Medium Energy Ion Scattering

ABSTRACTThe surface structure of epitaxial NiSi2 films grown on Si (111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the NiSi2 (111) surface are resolved.The topology of the NiSi2 (111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.

Structure Determination of the Nisi2 (111) Surface Using Medium Energy Ion Scattering with Monolayer Resolution

1990 ◽  
Vol 208 ◽  
Author(s):  
J. Vrijmoeth ◽  
P. M. Zagwijn ◽  
J. W. M. Frenken ◽  
J. F. Van Der Veen
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
New Method ◽  
Medium Energy ◽  
Ion Scattering ◽  
Triple Layer ◽  
Medium Energy Ion Scattering

ABSTRACTThe surface structure of epitaxial Nisi2 films grown on Si(111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the Nisi2 (111) surface are resolved.The topology of the Nisi2(111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.

Structure determination of theCoSi2(111) surface using medium-energy ion scattering

1989 ◽  
Vol 40 (5) ◽  
pp. 3121-3128 ◽  
Author(s):  
J. Vrijmoeth ◽  
A. G. Schins ◽  
J. F. van der Veen
Keyword(s):  
Structure Determination ◽  
Medium Energy ◽  
Ion Scattering ◽  
Medium Energy Ion Scattering

Structure determination of theGe(111)−c(2×8)surface by medium-energy ion scattering

1988 ◽  
Vol 38 (2) ◽  
pp. 1585-1588 ◽  
Author(s):  
P. M. J. Marée ◽  
K. Nakagawa ◽  
J. F. van der Veen ◽  
R. M. Tromp
Keyword(s):  
Structure Determination ◽  
Medium Energy ◽  
Ion Scattering ◽  
Medium Energy Ion Scattering

Structure determination of the and surface alloy phases by medium-energy ion scattering

1999 ◽  
Vol 11 (8) ◽  
pp. 1889-1901 ◽  
Author(s):  
D Brown ◽  
T C Q Noakes ◽  
D P Woodruff ◽  
P Bailey ◽  
Y Le Goaziou
Keyword(s):  
Structure Determination ◽  
Surface Alloy ◽  
Medium Energy ◽  
Ion Scattering ◽  
Medium Energy Ion Scattering

Surface structure of sphalerite studied by medium energy ion scattering and XPS

2007 ◽  
Vol 601 (2) ◽  
pp. 352-361 ◽  
Author(s):  
S.L. Harmer ◽  
L.V. Goncharova ◽  
R. Kolarova ◽  
W.N. Lennard ◽  
M.A. Muñoz-Márquez ◽  
...  
Keyword(s):  
Surface Structure ◽  
Medium Energy ◽  
Ion Scattering ◽  
Medium Energy Ion Scattering

Determination of Dimension and Conformal Arsenic Doping Profile of a Fin Field Effect Transistors by Time-of-Flight Medium Energy Ion Scattering

2019 ◽  
Vol 91 (14) ◽  
pp. 9315-9322 ◽  
Author(s):  
Won Ja Min ◽  
Jwasoon Kim ◽  
Kyungsu Park ◽  
Gabriel Marmitt ◽  
Jonathan England ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Time Of Flight ◽  
Doping Profile ◽  
Medium Energy ◽  
Ion Scattering ◽  
Arsenic Doping ◽  
Medium Energy Ion Scattering

Surface structure determination of Sn deposited on Pt(111) by low energy alkali ion scattering

1991 ◽  
Vol 254 (1-3) ◽  
pp. 45-57 ◽  
Author(s):  
S.H. Overbury ◽  
D.R. Mullins ◽  
M.T. Paffett ◽  
B.E. Koel
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
Low Energy ◽  
Ion Scattering ◽  
Alkali Ion
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