Abstract
Fatigue life prediction of electronic devices is of great importance in both research and industry. Traditionally, fatigue tests and finite element modeling (FEM) are the two main methods. This paper presents a new hybrid approach (FEM combined with artificial neural network, (ANN)) for fatigue life prediction. Finite element models on wafer-level chip scale packages (WLCSP) with different chip thickness, PCB thickness, and solder joint pitches were created to evaluate the effect of structure parameters on the increase in maximum creep strain under thermal fatigue load. Modified Coffin–Manson equation was then employed to estimate the corresponding fatigue life. ANNs were built, and then trained, tested, and optimized with the datasets from modeling to predict increase in maximum creep strain and fatigue life. For the ANN built for strain prediction, prediction accuracy of the optimal network was 97% in accuracy tests and 93% in generalization tests. Accuracy of the other ANN for predicting fatigue life was 94.2% in accuracy tests and 88% in generalization tests. This hybrid method shows very promising application in fatigue life estimation of electronic devices which requires much less time and lower cost.
