Peak Count Correction Methods for a Distance Sensor Using Self-coupling Effect of Semiconductor Laser

2010 ◽  
Vol 130 (12) ◽  
pp. 2100-2105 ◽  
Author(s):  
Tatsuya Ueno ◽  
Norio Tsuda ◽  
Jun Yamada
Keyword(s):  
Semiconductor Laser ◽  
Coupling Effect ◽  
Distance Sensor ◽  
Peak Count

Self-coupling Distance Sensor using a Terminal Voltage Change of the Semiconductor Laser

2014 ◽  
Vol 134 (12) ◽  
pp. 1796-1801 ◽  
Author(s):  
Takeshi Yoshimatsu ◽  
Keishiro Goshima ◽  
Norio Tsuda ◽  
Jun Yamada
Keyword(s):  
Semiconductor Laser ◽  
Voltage Change ◽  
Terminal Voltage ◽  
Distance Sensor

Sensitivity Improvement of Laser Microphone Using Self-coupling Effect of Semiconductor Laser

2018 ◽  
Vol 138 (1) ◽  
pp. 9-14 ◽  
Author(s):  
Daisuke Mizushima ◽  
Takeshi Yoshimatsu ◽  
Tsuyoshi Yamaguchi ◽  
Michihiro Aoki ◽  
Norio Tsuda ◽  
...  
Keyword(s):  
Semiconductor Laser ◽  
Coupling Effect ◽  
Sensitivity Improvement

Sound Detection by Laser Microphone Using Self-coupling Effect of Semiconductor Laser

2016 ◽  
Vol 136 (7) ◽  
pp. 1021-1026 ◽  
Author(s):  
Daisuke Mizushima ◽  
Takeshi Yoshimatsu ◽  
Keishiro Goshima ◽  
Norio Tsuda ◽  
Jun Yamada
Keyword(s):  
Semiconductor Laser ◽  
Coupling Effect ◽  
Sound Detection

Micro Displacement Measurement System using Self-coupling Effect of Semiconductor Laser

2014 ◽  
Vol 134 (11) ◽  
pp. 1684-1689
Author(s):  
Masakazu Mori ◽  
Keishiro Goshima ◽  
Norio Tsuda ◽  
Yasuhiko Nawa ◽  
Jun Yamada
Keyword(s):  
Semiconductor Laser ◽  
Measurement System ◽  
Coupling Effect ◽  
Displacement Measurement

scholarly journals Study on Small Vibration Sensor by Self-Coupling Effect of Semiconductor Laser

2008 ◽  
Vol 36 (APLS) ◽  
pp. 1250-1253 ◽  
Author(s):  
Yasuhiko NAWA ◽  
Norio TSUDA ◽  
Jun YAMADA
Keyword(s):  
Semiconductor Laser ◽  
Coupling Effect ◽  
Vibration Sensor ◽  
Small Vibration

Supersonic Band Characteristics of Laser Microphone Using Self-coupling Effect of Semiconductor Laser

2017 ◽  
Vol 137 (3) ◽  
pp. 489-494 ◽  
Author(s):  
Daisuke Mizushima ◽  
Takeshi Yoshimatsu ◽  
Tsuyoshi Yamaguchi ◽  
Keishiro Goshima ◽  
Norio Tsuda ◽  
...  
Keyword(s):  
Semiconductor Laser ◽  
Coupling Effect

scholarly journals Small Vibration Sensor Using Self-Coupling Effect of Semiconductor Laser

2009 ◽  
Vol 37 (8) ◽  
pp. 619-623 ◽  
Author(s):  
Yasuhiko NAWA ◽  
Norio TSUDA ◽  
Jun YAMADA
Keyword(s):  
Semiconductor Laser ◽  
Coupling Effect ◽  
Vibration Sensor ◽  
Small Vibration

Quantitative EPMA of nitrogen : A tricky element in the electron-probe microanalyzer

1992 ◽  
Vol 50 (2) ◽  
pp. 1622-1623
Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers
Keyword(s):  
Background Subtraction ◽  
Electron Probe ◽  
Detection System ◽  
Higher Order ◽  
Light Elements ◽  
Strong Suppression ◽  
Electron Probe Microanalyzer ◽  
Quantitative Epma ◽  
Peak Count ◽  
Lead Stearate

Among the ultra-light elements B, C, N, and O nitrogen is the most difficult element to deal with in the electron probe microanalyzer. This is mainly caused by the severe absorption that N-Kα radiation suffers in carbon which is abundantly present in the detection system (lead-stearate crystal, carbonaceous counter window). As a result the peak-to-background ratios for N-Kα measured with a conventional lead-stearate crystal can attain values well below unity in many binary nitrides . An additional complication can be caused by the presence of interfering higher-order reflections from the metal partner in the nitride specimen; notorious examples are elements such as Zr and Nb. In nitrides containing these elements is is virtually impossible to carry out an accurate background subtraction which becomes increasingly important with lower and lower peak-to-background ratios. The use of a synthetic multilayer crystal such as W/Si (2d-spacing 59.8 Å) can bring significant improvements in terms of both higher peak count rates as well as a strong suppression of higher-order reflections.

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