Micro Displacement Measurement System using Self-coupling Effect of Semiconductor Laser

2014 ◽  
Vol 134 (11) ◽  
pp. 1684-1689
Author(s):  
Masakazu Mori ◽  
Keishiro Goshima ◽  
Norio Tsuda ◽  
Yasuhiko Nawa ◽  
Jun Yamada
Keyword(s):  
Semiconductor Laser ◽  
Measurement System ◽  
Coupling Effect ◽  
Displacement Measurement

Dual interferometric displacement measurement system incorporating a Wollaston interferometer

1997 ◽  
Author(s):  
James E. Kemp ◽  
X. Q. Jiang ◽  
Yanong N. Ning ◽  
Andrew W. Palmer ◽  
Kenneth T. V. Grattan
Keyword(s):  
Measurement System ◽  
Displacement Measurement

A high-precision laser displacement measurement system

2021 ◽  
Author(s):  
Wenqing Pan ◽  
Dengwei Zhang ◽  
Cui Liang ◽  
Chao Ma ◽  
Xiaowu Shu ◽  
...  
Keyword(s):  
High Precision ◽  
Measurement System ◽  
Displacement Measurement

On-Line Displacement Measurement System Based on Multiplexed Optical Fiber Mach-Zenhder Heterodyne Interferometry

2019 ◽  
Vol 46 (9) ◽  
pp. 0904007
Author(s):  
王韵致 Yunzhi Wang ◽  
谢芳 Fang Xie ◽  
陈龙辉 Longhui Chen ◽  
徐海波 Haibo Xu ◽  
李明佳 Mingjia Li
Keyword(s):  
Optical Fiber ◽  
Measurement System ◽  
Displacement Measurement ◽  
Heterodyne Interferometry ◽  
On Line
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