Topology Optimization of Superconducting Electromagnets for Particle Accelerators

Yusuke Sakamoto; Daisuke Ishizuka; Tetsuya Matsuda; Kazuhiro Izui; Shinji Nishiwaki

doi:10.1541/ieejpes.139.568

Topology Optimization of Superconducting Electromagnets for Particle Accelerators

IEEJ Transactions on Power and Energy ◽

10.1541/ieejpes.139.568 ◽

2019 ◽

Vol 139 (9) ◽

pp. 568-575

Author(s):

Yusuke Sakamoto ◽

Daisuke Ishizuka ◽

Tetsuya Matsuda ◽

Kazuhiro Izui ◽

Shinji Nishiwaki

Keyword(s):

Topology Optimization ◽

Particle Accelerators

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Topology Optimization of Coils for Particle Accelerators

The Proceedings of OPTIS ◽

10.1299/jsmeoptis.2018.13.115 ◽

2018 ◽

Vol 2018.13 (0) ◽

pp. 115

Author(s):

Yusuke Sakamoto ◽

Daisuke Ishizuka ◽

Tetsuya Matsuda ◽

Kazuhiro Izui ◽

Shinji Nishiwaki

Keyword(s):

Topology Optimization ◽

Particle Accelerators

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Specimen Preparation of Near Surface Ion Irradiated Samples

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100117820 ◽

1985 ◽

Vol 43 ◽

pp. 170-171

Author(s):

K. F. Russell ◽

L. L. Horton

Keyword(s):

Radiation Damage ◽

Heavy Ions ◽

Target Material ◽

Metal Alloys ◽

Specimen Surface ◽

Specimen Preparation ◽

Particle Accelerators ◽

Near Surface ◽

Graaff Accelerator ◽

Van De Graaff

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.

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