High relative humidity affects vitreousness of durum wheat [Triticum turgidumL. var.durum(Desf)]

2009 ◽  
Vol 37 (2) ◽  
pp. 269-275 ◽  
Author(s):  
K. Sandhu ◽  
F. Manthey ◽  
E. Elias

2014 ◽  
Vol 42 (8) ◽  
pp. 879-884 ◽  
Author(s):  
Rosa López-Gigosos ◽  
Alberto Mariscal ◽  
Mario Gutierrez-Bedmar ◽  
Eloisa Mariscal-Lopez ◽  
Joaquín Fernández-Crehuet


1973 ◽  
Vol 10 (5) ◽  
pp. 292-300 ◽  
Author(s):  
Mitsuo NARITOMI ◽  
Yoshikazu YOSHIDA ◽  
Seiji FUKUDA


2012 ◽  
Vol 28 (1) ◽  
pp. 670-679 ◽  
Author(s):  
Abdulrahman Alhozaimy ◽  
Raja Rizwan Hussain ◽  
Rajeh Al-Zaid ◽  
Abdulaziz Al-Negheimish


1984 ◽  
Vol 52 (1) ◽  
pp. 86-86 ◽  
Author(s):  
William Lichten ◽  
Paul McGrath








2005 ◽  
Vol 2 (1) ◽  
pp. 33-36
Author(s):  
Baghdad Science Journal

Studied red beetle life on each of the yen and wheat durum wheat, barley, corn, rice, chickpeas, ground peanuts and beans in Living situation constant temperature and relative humidity of 65% for a period of 66 days was the life cycle of the insect different from one substance to another ....



2000 ◽  
Author(s):  
Herbert R. Shea ◽  
Carolyn D. White ◽  
Arman Gasparyan ◽  
Robert B. Comizzoli ◽  
Susanne Arney

Abstract We present a study of the anodic oxidation of MEMS poly-Silicon electrodes and wires in ambients with high relative humidity and high voltages. MEMS poly-Si electrodes that are hermetically packaged in dry ambients show no signs of degradation on a time scale of years even when operated at hundreds of volts. To accelerate electrical failure modes, we expose unpackaged chips to ambients with high relative humidity. We then observe anodic oxidation of the most positively biased poly-Si structures on a time scale of minutes or hours. We describe this anodic oxidation as a function of relative humidity and voltage, and its dependence on surface leakage currents.



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