Crystal Structure of the Compound Bi2Zn2/3Nb4/3O7

2002 ◽  
Vol 17 (6) ◽  
pp. 1406-1411 ◽  
Author(s):  
Igor Levin ◽  
Tammy G. Amos ◽  
Juan C. Nino ◽  
Terrell A. Vanderah ◽  
Ian M. Reaney ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Neutron Diffraction ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Neutron Powder Diffraction ◽  
Neutron Diffraction Data ◽  
Structural Refinement ◽  
Large Component ◽  
X Ray ◽  
Thermal Displacements

The crystal structure of Bi2Zn2/3Nb4/3O7 was determined using a combination of electron, x-ray, and neutron powder diffraction. The compound crystallizes with a monoclinic zirconolite-like structure [C2/c (No.15) space group, a = 13.1037(9) Å, b = 7.6735(3) Å, c = 12.1584(6) Å, β = 101.318(5)°]. According to structural refinement using neutron diffraction data, Nb preferentially occupies six-fold coordinated sites in octahedral sheets parallel to the (001) planes, while Zn is statistically distributed between two half-occupied (5 + 1)-fold coordinated sites near the centers of six-membered rings of [Nb(Zn)O6] octahedra. The Nb/Zn cation layers alternate along the c-axis with Bi-layers, in which Bi cations occupy both eight- and seven-fold coordinated sites. The eight-fold coordinated Bi atoms exhibited strongly anisotropic thermal displacements with an abnormally large component directed approximately along the c-axis (normal to the octahedral layers).

Neutron Diffraction from Novel Materials

MRS Bulletin ◽  
1999 ◽  
Vol 24 (12) ◽  
pp. 24-28
Author(s):  
Paolo G. Radaelli ◽  
James D. Jorgensen
Keyword(s):  
Crystal Structure ◽  
Neutron Diffraction ◽  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Neutron Powder Diffraction ◽  
Inorganic Crystal Structure Database ◽  
Powder Diffraction Data ◽  
New Materials ◽  
X Ray

The discovery and development of new materials is the foundation of the science and technology “food chains.” Examples of new materials with novel properties that have stimulated new scientific questions and/or led to new technologies include liquid crystals, advanced batteries, structural ceramics, dielectrics, ferroelectrics, catalysts, high-temperature superconductors, har dmagnets, and magnetoresistive devices. Establishing the crystal structure of a newly discovered Compound is a mandatory first step, but the most important contribution of diffraction techniques is to provide an understanding of the relationships among chemical composition, crystal structure, and physical behavior. In this way, diffraction experiments provide critical Information for testing theories that explain novel behavior and guide the optimization of new materials to meet the demands of emerging technologies.The first samples of newly discovered materials are often polycrystalline. With state-of-the-art neutron powder diffraction data and Rietveld refinement techniques, for structures of modest complexity, the precision for atom positions rivals that obtained by single-crystal diffraction. Rietveld refinement is a method of obtaining accurate values for atom positions and other structural parameters from powder diffraction data by least-squares fitting of a calculated model to the full diffraction pattern. As evidence of thi s success, the Inorganic Crystal Structure Database contains 6044 entries from neutron powder diffraction, 7096 from laboratory x-ray powder diffraction, an d 228 from Synchrotron x-ray powder diffraction. Other reasons for the rapidly growing impact of neutron diffraction include the favorable neutron-scattering cross sections for light elements, the sensitivity to magnetic moments, and the ability to penetrate special sample environments for in situ studies. These strengths are widely accepted and have been exploited for many years. Previous reviews have focused on these topics.

Determination and Rietveld refinement of the crystal structure of Li0.50Ni0.25TiO(PO4) from powder X-ray and neutron diffraction

2002 ◽  
Vol 17 (4) ◽  
pp. 290-294 ◽  
Author(s):  
B. Manoun ◽  
A. El Jazouli ◽  
P. Gravereau ◽  
J. P. Chaminade ◽  
F. Bouree
Keyword(s):  
Crystal Structure ◽  
Neutron Diffraction ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Rietveld Method ◽  
Neutron Powder Diffraction ◽  
Powder Diffraction Data ◽  
X Ray ◽  
Neutron Powder Diffraction Data ◽  
Monoclinic Cell

The structure of the oxyphosphate Li0.50Ni0.25TiO(PO4) has been determined from conventional X-ray and neutron powder diffraction data. The parameters of the monoclinic cell (space group P21/c, Z=4), obtained from X-ray results, are: a=6.3954(6) Å, b=7.2599(6) Å, c=7.3700(5) Å, and β=90.266(6)°; those resulting from neutron study are: a=6.3906(7) Å, b=7.2568(7) Å, c=7.3673(9) Å, and β=90.234(7)°. Refinement by the Rietveld method using whole profile, leads to satisfactory reliability factors: cRwp=0.128, cRp=0.100, and RB=0.038 for X-ray and cRwp=0.110, cRp=0.120, and RB=0.060 for neutrons. The structure of Li0.50Ni0.25TiO(PO4) can be described as a TiOPO4 framework constituted by chains of tilted corner-sharing TiO6 octahedra running parallel to the c axis and cross linked by phosphate tetrahedra. In this framework, there are octahedral cavities occupied by Li and Ni atoms: Li occupies the totality of the 2a sites and Ni occupies statistically half of the 2b sites. Ti atoms are displaced from the center of octahedra units in alternating long (2.242 Å) and short (1.711 Å) Ti–O bonds along chains.

Preparation and crystal structure of garnet-type calcium zirconium germanate Ca4ZrGe3O12

2016 ◽  
Vol 31 (4) ◽  
pp. 292-294 ◽  
Author(s):  
V. D. Zhuravlev ◽  
A. P. Tyutyunnik ◽  
N. I. Lobachevskaya
Keyword(s):  
Crystal Structure ◽  
Unit Cell Parameter ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Cell Parameter ◽  
Polycrystalline Sample ◽  
Structural Formula ◽  
Powder Diffraction Data ◽  
Structural Refinement ◽  
X Ray

A polycrystalline sample of Ca4ZrGe3O12 was synthesized using the nitrate–citrate method and heated at 850–1100 °C. Structural refinement based on X-ray powder diffraction data showed that the crystal structure is of the garnet type with a cubic unit-cell parameter [a = 12.71299(3) Å] and the space group Ia$\bar 3$d. The structural formula is presented as Ca3[CaZr]octa[Ge]tetraO12.

Measurement of Atomic Elastic Constants by Pulsed Neutron Powder Diffraction

1992 ◽  
Vol 36 ◽  
pp. 577-583
Author(s):  
A. C. Lawson ◽  
G. H. Kwei ◽  
J. A. Goldstone ◽  
B. Cort ◽  
R. I. Sheldon ◽  
...  
Keyword(s):  
High Temperature ◽  
Neutron Diffraction ◽  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Elastic Constants ◽  
Diffraction Data ◽  
High Temperature Superconductors ◽  
Neutron Powder Diffraction ◽  
Neutron Diffraction Data ◽  
Pulsed Neutron

AbstractWe have developed a technique for determining the atomic elastic constants from measurements of the Debye-Waller factors. The Debye-Waller factors are obtained by Rietveld refinement of time-of-flight neutron diffraction data and interpreted in terms of an atomic Debye-Waller temperature. The method is applicable to powders and to materials that must be encapsulated for safety or environmental reasons. We will illustrate our technique with applications to actinide metals, to metallic hydrides and to high-temperature superconductors.

FINAX: a computer program for correcting diffraction angles, refining cell parameters and calculating powder patterns

1983 ◽  
Vol 16 (6) ◽  
pp. 651-653 ◽  
Author(s):  
E. R. Hovestreydt
Keyword(s):  
Neutron Diffraction ◽  
Computer Program ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Neutron Diffraction Data ◽  
X Ray ◽  
Cell Parameters ◽  
Theoretical Line ◽  
Diffraction Patterns ◽  
Line Positions

A computer program is described, whose purpose is the refinement of cell parameters from X-ray or neutron diffraction data. It is of particular use when working with powder diffraction patterns, as it has the possibility of (a) correcting the measured diffraction angles from reference reflections and of (b) calculating a theoretical powder diffractogram, including intensities. A minimum of crystallographic information has to be given and input is partially in free format. E.s.d.'s in cell parameters, as well as in the volume, are calculated. It handles α 1−α 2 splitting and calculates, apart from the theoretical line positions, also a more realistic position of where to expect a given reflection on the film.

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