Electrical Relaxation Studies in Fluorite Oxides

MRS Proceedings ◽

10.1557/proc-135-271 ◽

1988 ◽

Vol 135 ◽

Author(s):

Partho Sarkar ◽

Patrick S. Nicholson

Keyword(s):

Solid Solutions ◽

Oxygen Vacancies ◽

Electric Modulus ◽

Dopant Concentration ◽

Low Frequency ◽

Relaxation Processes ◽

Modulus Formalism ◽

Free Oxygen ◽

Range Migration ◽

Electric Modulus Formalism

AbstractElectric relaxation in CeO2-M203 (M34 sY3+, La3+) solid solutions has been investigated as a function of temperature (373K-673K) using the electric modulus formalism in the frequency range 5 to 107Hz. Two relaxation processes are observed in dilute solid solutions. The low frequency process is identified as a long range migration of free oxygen-vacancies (Process A) and the high frequency process is due to reorientation relaxation of the (MceVo) charged associates (Process B). The relaxation process is analysed using a non-exponential decay function, ø(t)=exp[-(t/τo)B] for O<β≤1, of the electric field. The observed activation enthalpy minimum as a function of dopant concentration for the Process A is explained using the concept of incomplete dissociation of oxygen-vacancies from (MceVo) defect associates and the formation of higher-order defect clusters at higher mole% M203.

Download Full-text

Comments on the electric modulus formalism model and superior alternatives to it for the analysis of the frequency response of ionic conductors

Journal of Physics and Chemistry of Solids ◽

10.1016/j.jpcs.2008.12.012 ◽

2009 ◽

Vol 70 (3-4) ◽

pp. 546-554 ◽

Cited By ~ 21

Author(s):

J. Ross Macdonald

Keyword(s):

Frequency Response ◽

Electric Modulus ◽

Ionic Conductors ◽

Modulus Formalism ◽

Electric Modulus Formalism

Download Full-text

Electric modulus formalism and electrical transport property of ball mill synthesized nanocrystalline Mn doped ZrO2 solid solution

Physica B Condensed Matter ◽

10.1016/j.physb.2015.09.036 ◽

2015 ◽

Vol 479 ◽

pp. 67-73 ◽

Cited By ~ 6

Author(s):

S. Saha ◽

A. Nandy ◽

A.K. Meikap ◽

S.K. Pradhan

Keyword(s):

Solid Solution ◽

Transport Property ◽

Electrical Transport ◽

Ball Mill ◽

Electric Modulus ◽

Electrical Transport Property ◽

Modulus Formalism ◽

Mn Doped ◽

Electric Modulus Formalism

Download Full-text

STRUCTURAL AND DIELECTRIC PROPERTIES OF GLASSES IN THE SYSTEM TeO2–CaCu3Ti4O12

Journal of Advanced Dielectrics ◽

10.1142/s2010135x12500208 ◽

2012 ◽

Vol 02 (04) ◽

pp. 1250020 ◽

Cited By ~ 6

Author(s):

P. THOMAS ◽

K. B. R. VARMA

Keyword(s):

Dielectric Constant ◽

Electric Modulus ◽

Differential Scanning Calorimetric ◽

Frequency Range ◽

Low Loss ◽

Modulus Formalism ◽

X Ray ◽

Dielectric Constant And Loss ◽

Frequency Independent ◽

Electric Modulus Formalism

The glasses in the system (100 - x) TeO2 –x CaCu3Ti4O12 , (x = 0.25 mol. % to 3 mol.%) were fabricated. The color varied from olive green to brown as the CaCu3Ti4O12 (CCTO) content increased in TeO2 matrix. The X-ray powder diffraction and differential scanning calorimetric analyses that were carried out on the as-quenched samples confirmed their amorphous and glassy nature respectively. The dielectric constant and loss in the 100 Hz–1 MHz frequency range were monitored as a function of temperature (50–400°C). The dielectric constant [Formula: see text] and the loss (D) increased as the CCTO content increased in TeO2 at all the frequencies and temperatures under investigation. Further, the [Formula: see text] and D were found to be frequency-independent in the 50–200°C temperature range. The value obtained for the loss at 1 MHz was 0.0019 which was typical of low loss materials, and exhibited near constant loss (NCL) in the 100 Hz–1 MHz frequency range. The electrical relaxation was rationalized using the electric modulus formalism. These glasses may be of considerable interest as substrates for high frequency circuit elements in conventional semiconductor industries owing to their high thermal stability.

Download Full-text