“Column-By-Column” Compositional Mapping At Semiconductor Interfaces Using Z-Contrast Stem

AbstractA new strategy for atomic resolution compositional mapping at semiconductor interfaces is presented. Images can be interpreted directly to within 10% to give column-by-column compositional information with a sensitivity approaching Rutherford scattering cross sections. We apply the method to obtain the first atomic resolution images of interfacial ordering in ultrathin (SimGen)p superlattices and attribute the results to growth on (2 × 1) and (1 × 2) reconstructed surfaces.

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Ion Beam Analysis of O, N, and B Compositions in Materials Using Non-Rutherford Scattering of Protons

MRS Proceedings ◽

10.1557/proc-128-375 ◽

1988 ◽

Vol 128 ◽

Author(s):

N. R. Parikh ◽

Z. H. Zhang ◽

M. L. Swanson ◽

N. Yu ◽

W. K. Chu

Keyword(s):

Cross Section ◽

Cross Sections ◽

Ion Beam ◽

Proton Scattering ◽

Light Elements ◽

Ion Scattering ◽

Scattering Cross ◽

Beam Analysis ◽

Rutherford Scattering ◽

Scattering Cross Sections

ABSTRACTElastic scattering of protons with energies from 1.5 MeV to 2 MeV was used to determine the concentration of oxygen in Y-Ba-Cu-O compound, nitrogen in GaN films, and boron in B-Si glass and other materials. Proton scattering from light elements in this energy range exhibits non-Rutherford scattering cross section, which are enhanced by a factor of 3 to 6 or more relative to the Rutherford scattering cross sections. Thus the sensitivity for the light clement detection is considerably larger than that obtained by He ion scattering.Quantitative analysis by proton scattering is discussed and compared with other methods.

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Elastic backscattering measurments for 6,7Li+58Ni, 6,7Li+116,120Sn, 6,7Li+208Pb at near barrier energies

HNPS Proceedings ◽

10.12681/hnps.2553 ◽

2019 ◽

Vol 18 ◽

pp. 201

Author(s):

K. Zerva ◽

... Et al.

Keyword(s):

Elastic Scattering ◽

Recent Work ◽

Cross Sections ◽

Reaction Mechanisms ◽

Weakly Bound ◽

Excitation Functions ◽

Scattering Cross ◽

Rutherford Scattering ◽

Elastic Backscattering ◽

Scattering Cross Sections

We have performed, elastic backscattering measurements for the weakly bound nuclei 6,7Li on the medium and heavy mass targets 58Ni, 116,120Sn, 208Pb at sub- and near-barrier energies (0.6 to 1.3 EC.b.). Excitation functions of elastic scattering cross sections have been measured at 160O and 170O and the corresponding ratios to Rutherford scattering and relevant barrier distributions have been extracted. These measurements will complement recent work on a 28Si target for probing the potential at sub- and near barrier energies and relevant reaction mechanisms.

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Deviations from Rutherford-scattering cross sections

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(90)90548-9 ◽

1990 ◽

Vol 51 (4) ◽

pp. 311-319 ◽

Cited By ~ 53

Author(s):

Michael Bozoian ◽

Kevin M. Hubbard ◽

Michael Nastasi

Keyword(s):

Cross Sections ◽

Scattering Cross ◽

Rutherford Scattering ◽

Scattering Cross Sections

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Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images

Ultramicroscopy ◽

10.1016/j.ultramic.2013.07.002 ◽

2013 ◽

Vol 133 ◽

pp. 109-119 ◽

Cited By ~ 90

Author(s):

H. E ◽

K.E. MacArthur ◽

T.J. Pennycook ◽

E. Okunishi ◽

A.J. D'Alfonso ◽

...

Keyword(s):

Cross Sections ◽

Atomic Resolution ◽

Scattering Cross ◽

Scattering Cross Sections

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BARRIER DISTRIBUTION OF QUASI-ELASTIC BACKWAD SCATTERING IN VERY HEAVY REACTION SYSTEMS

International Journal of Modern Physics E ◽

10.1142/s0218301310015436 ◽

2010 ◽

Vol 19 (05n06) ◽

pp. 989-996

Author(s):

S. MITSUOKA ◽

H. IKEZOE ◽

K. NISHIO ◽

Y. WATANABE ◽

S. C. JEONG ◽

...

Keyword(s):

Cross Sections ◽

Cold Fusion ◽

Channel Calculation ◽

Barrier Heights ◽

Scattering Cross ◽

Rutherford Scattering ◽

Barrier Distribution ◽

Coupled Channel Calculation ◽

Coupled Channel ◽

Scattering Cross Sections

We have measured quasi-elastic backward scattering in the reactions of 48 Ti , 54 Cr , 56 Fe , 64 Ni , 70 Zn , 76 Ge and 86 Kr + 208 Pb to study the nucleus-nucleus interaction in Pb -based cold fusion. The barrier distributions were obtained from the first derivative of the measured excitation functions of quasi-elastic scattering cross sections normalized to the Rutherford scattering cross sections. The centroids of the barrier distributions showed deviations from several predicted barrier heights toward the low energy side except for the Christensen-Winther potential and the Aküz-Winther potential. The shapes of the barrier distributions were well reproduced by the results of a coupled-channel calculation taking account of the coupling effects of multi-phonon excitations of the quadrupole vibration for the projectiles and of the octupole vibration for the 208 Pb target. The present barrier distributions were also well reproduced by a semiclassical calculation taking into account the couplings of transfer channels and single-phonon excitations in the projectiles and the target.

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Absolute inner-shell cross section determination for EELS analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010010473x ◽

1988 ◽

Vol 46 ◽

pp. 534-535

Author(s):

P.A. Crozier

Keyword(s):

Cross Section ◽

Cross Sections ◽

Absolute Cross Section ◽

Specimen Thickness ◽

Mass Thickness ◽

Scattering Cross ◽

Before And After ◽

Estimated Error ◽

Scattering Cross Sections ◽

Electron Microscopist

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.

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