scholarly journals Anisotropic Displacement Threshold Energies in Silicon by Molecular Dynamics Simulations

1990 ◽  
Vol 209 ◽  
Author(s):  
LeAnn A. Miller ◽  
David K. Brice ◽  
Anil K. Prinja ◽  
S. Thomas Picraux

AbstractA combination of molecular dynamics simulations and theoretical modeling was used to examine the orientation dependent threshold energies for displacement of silicon atoms from their lattice site due to energetic particle collisions. These results are important for a detailed understanding of both radiation effects in silicon devices and beam-enhanced stimulation of molecular beam epitaxial growth.The molecular dynamics code developed for this study, which employs a Tersoff interaction potential, as well as the theoretical model that incorporates the symmetry of the crystal are described.Bulk displacement threshold energies were determined by the molecular dynamics code for four directions through the open face in the <111>. These values were then incorporated into the theoretical model for the average bulk displacement threshold energy. The average bulk displacement threshold energy was found to be 14.8 eV in 30° about <111> and 11.1 eV in 20° about <100>.

1994 ◽  
Vol 129 (1-2) ◽  
pp. 127-131 ◽  
Author(s):  
Leann A. Miller ◽  
David K. Brice ◽  
Anil K. Prinja ◽  
S. Thomas Picraux

1988 ◽  
Vol 141 ◽  
Author(s):  
B. J. Garrison ◽  
M. T. Miller ◽  
D.W. Brenner

Summary:Molecular dynamics simulations have been performed that examine the microscopic mechanisms of rearrangements of atoms on the Si{ 1001 surface due to deposition of gas phase atoms. For thermal energy deposition we find that the gas atoms initially attach to dangling bonds of the surface dimer atoms. The dimer ’unreconstruction’ is due to a diffusion event on the surface, thus is temperature activated. We also find that dimers may open in regions of the surface where there are several atoms not at lattice sites, thus a low temperature amorphous structure. For 5-10 eV deposition there are direct mechanisms of dimer opening that occur on the 50-100 fs timescale. For energies greater than 15-20 eV there is implantation of the silicon atoms which leads to subsurface damage.


2018 ◽  
Vol 20 (19) ◽  
pp. 13145-13152 ◽  
Author(s):  
S. Zink ◽  
F. A. Moura ◽  
P. Alves da Silva Autreto ◽  
D. S. Galvão ◽  
B. Mizaikoff

Theoretical model of molecularly imprinted polymers based on molecular dynamics simulations.


2012 ◽  
Vol 1475 ◽  
Author(s):  
Le-Hai Kieu ◽  
Jean-Marc Delaye ◽  
Claude Stolz

ABSTRACTClassical molecular dynamics simulations were used to compare the fracture behavior of pristine and disordered specimens of a simplified nuclear glass. The disordered specimen is prepared in order to mimic the effects of accumulating displacement cascades. It is characterized by a decreasing Boron coordination and an increasing Na concentration in a modifying role. We observe an enhancement of the plasticity of the disordered glass and a decrease of the elastic limit, resulting in greater fracture toughness. The simulation findings are consistent with experimental results.


Nanoscale ◽  
2020 ◽  
Vol 12 (47) ◽  
pp. 24138-24145
Author(s):  
Anran Wei ◽  
Han Ye ◽  
Yang Gao ◽  
Fenglin Guo

A theoretical model is developed to demonstrate the relationship between the fold length and thermal transport behavior in self-folded graphene film, validated by molecular dynamics simulations. The effect of tension is also revealed by this model.


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