Grain Boundaries in NiO
Keyword(s):
AbstractDefocus-imaging and high-resolution electron microscopy (HREM) are used to study tilt grain boundaries (GB) in NiO near the <001> axis over the whole range of possible misorientation. Faceting and structural periodicities within facets are observed in high- and low-angle GBs. A reduced atomic density at high-angle GBs is suggested by the defocus behavior.
1995 ◽
Vol 53
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pp. 172-173
1990 ◽
Vol 24
(1)
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pp. 201-206
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1985 ◽
Vol 24
(Part 1, No. 7)
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pp. 896-897
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1985 ◽
Vol 24
(Part 2, No. 1)
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pp. L30-L32
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1996 ◽
Vol 11
(8)
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pp. 1880-1890
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1991 ◽
Vol 64
(1)
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pp. 245-253
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