Ion Energy Distributions in Silane-Hydrogen Plasmas

1996 ◽  
Vol 420 ◽  
Author(s):  
E. A. G. Hamers ◽  
W. G. J. H. M. Van Sark ◽  
J. Bezemer ◽  
W. F. Van Der Weg ◽  
W. J. Goedheer

AbstractFor the first time ion energy distributions (IED) of different ions from silane-hydrogen (SiH4-H2 ) RF plasmas are presented, i.e. the distributions of SiH3+, SiH2+ and SiH2+. The energy distributions of SiH3+ and SiH3+ ions show peaks, which are caused by a charge exchange process in the sheath. A method is presented by which the net charge density in the sheath is determined from the plasma potential and the energy positions of the charge exchange peaks. Knowing the net charge density in the sheath and the plasma potential, the sheath thickness can be determined and an estimation of the absolute ion fluxes can be made. The flux of ions can, at maximum, account for 10% of the observed deposition rate.

1995 ◽  
Vol 396 ◽  
Author(s):  
SH.M. Makhkamov ◽  
S.N. Abdurakhmanova

AbstractStudies of galvanomagnetic and electrical parameters of p- type Si : SiO2 in the temperature range 80 – 400 K have shown that X-ray irradiation at 80 K (Mo Ka,β and braking radiation hvmax. = 50 heV) leads to various transformations of the spectrum of electron- hole states in the band gap of such material, depending on the flux density of the X-rays. Two main processes are observed: the defect (vacancy and divacancy) formation and a charge exchange of native defects localized at the Si – SiO2 interface. The charge exchange process is rather collective and stimulated one because it is in response to an X-ray-induced ferroelectric phase transition in the SiO2- phase.


1995 ◽  
Vol 36 (4) ◽  
pp. 488-495 ◽  
Author(s):  
I. F. Shaikhislamov ◽  
V. M. Antonov ◽  
Yu. P. Zakharov ◽  
A. V. Melekhov ◽  
V. G. Posukh ◽  
...  

2015 ◽  
Vol 22 (11) ◽  
pp. 113503 ◽  
Author(s):  
T. Sairam ◽  
Pragya Bhatt ◽  
Ajit Kumar ◽  
Herendra Kumar ◽  
C. P. Safvan

1994 ◽  
Vol 35 (3) ◽  
pp. 481-486 ◽  
Author(s):  
Yu. P. Zakharov ◽  
O. M. Orishich ◽  
V. N. Snytnikov ◽  
I. F. Shaikhislamov

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