New Bounds on the Feedforward Design of Optical Output Buffer Multiplexers and Switches

2009 ◽  
Vol E92-B (4) ◽  
pp. 1183-1190 ◽  
Author(s):  
Xiaoliang WANG ◽  
Xiaohong JIANG ◽  
Susumu HORIGUCHI
Keyword(s):  
2016 ◽  
Vol 37 (2) ◽  
Author(s):  
Yuh-Jiuh Cheng ◽  
Yhi Shiau

AbstractIn this paper, an all-optical network composed of the ROADMs (reconfigurable optical add-drop multiplexer), L2/L3 optical packet switches, and the fiber optical cross-connection for fiber scheduling and measurement based on LCoS (liquid crystal on silicon) technologies is proposed. The L2/L3 optical packet switches are designed with optical output buffers. Only the header of optical packets is converted to electronic signals to control the wavelength of input ports and the packet payloads can be transparently destined to their output ports. An optical output buffer is designed to queue the packets when more than one incoming packet should reach to the same destination output port. For preserving service-packet sequencing and fairness of routing sequence, a priority scheme and a round-robin algorithm are adopted at the optical output buffer. The wavelength of input ports is designed for routing incoming packets using LCoS technologies. Finally, the proposed OFS (optical flow switch) with input buffers can quickly transfer the big data to the output ports and the main purpose of the OFS is to reduce the number of wavelength reflections. The all-optical content delivery network is comprised of the OFSs for a large amount of audio and video data transmissions in the future.


Author(s):  
F. Siegelin ◽  
C. Brillert

Abstract A failure analysis case study for oxide confined vertical cavity surface emitting laser (VCSEL) arrays will be presented. The focus of this work is on devices failing with a reduced optical output due to a rapid degradation of the laser diode. The complete analysis flow will be shown, including electrical and optical characterization as well as detailed investigations on a nanometer scale. It is known that these fails are caused by dislocations. An advanced FIB preparation method enabled cross-section and plan view TEM to successfully visualize the complete extent of a dislocation network.


2021 ◽  
pp. 109529
Author(s):  
Jiang Peng ◽  
Jingliang Xing ◽  
Jiakun Bai ◽  
Ying Ren ◽  
Tao Wang ◽  
...  

2011 ◽  
Vol 99 (6) ◽  
pp. 061105 ◽  
Author(s):  
F. Tan ◽  
R. Bambery ◽  
M. Feng ◽  
N. Holonyak,

1998 ◽  
Vol 16 (12) ◽  
pp. 2202-2211 ◽  
Author(s):  
A. Misawa ◽  
Y. Yamada ◽  
M. Tsukada ◽  
K. Sasayama ◽  
K. Habara ◽  
...  
Keyword(s):  

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