Failure Analysis of Vertical Cavity Surface Emission Laser Diodes

2003 ◽  
Author(s):  
F. Siegelin ◽  
C. Brillert
Keyword(s):  
Failure Analysis ◽  
Complete Analysis ◽  
Cavity Surface ◽  
Dislocation Network ◽  
Plan View ◽  
Surface Emission ◽  
Optical Output ◽  
Vertical Cavity Surface ◽  
Vcsel Arrays ◽  
Vertical Cavity

Abstract A failure analysis case study for oxide confined vertical cavity surface emitting laser (VCSEL) arrays will be presented. The focus of this work is on devices failing with a reduced optical output due to a rapid degradation of the laser diode. The complete analysis flow will be shown, including electrical and optical characterization as well as detailed investigations on a nanometer scale. It is known that these fails are caused by dislocations. An advanced FIB preparation method enabled cross-section and plan view TEM to successfully visualize the complete extent of a dislocation network.

Lasing on surface states in vertical-cavity surface-emission lasers

2014 ◽  
Vol 39 (19) ◽  
pp. 5582
Author(s):  
Yonan Su ◽  
Chun-Yan Lin ◽  
Ray-Ching Hong ◽  
Wen-Xing Yang ◽  
Chien-Chung Jeng ◽  
...  
Keyword(s):  
Surface States ◽  
Cavity Surface ◽  
Surface Emission ◽  
Vertical Cavity Surface ◽  
Vertical Cavity

Design for Reliability and Common Failure Mechanisms in Vertical Cavity Surface Emitting Lasers

2012 ◽  
Vol 1432 ◽  
Author(s):  
Robert W. Herrick
Keyword(s):  
Failure Analysis ◽  
Semiconductor Lasers ◽  
Failure Mechanisms ◽  
Cavity Surface ◽  
Reliability Testing ◽  
Materials Selection ◽  
Surface Emitting Lasers ◽  
Vertical Cavity Surface ◽  
Emitting Lasers ◽  
Vertical Cavity

ABSTRACTVertical-Cavity Surface-Emitting Lasers are making up a large and growing share of the world’s production of semiconductor lasers. But the 850 nm GaAs quantum well VCSELs that make up most of present product are highly vulnerable to dislocation networks. In this paper, we discuss how materials selection affects the reliability of semiconductor lasers generally. We then describe the most common failure mechanisms observed in VCSELs, and what precautions are used to prevent them. We finish with a brief discussion of reliability testing and failure analysis.

scholarly journals A simple model for cavity enhanced slow lights in vertical cavity surface emission lasers

2008 ◽  
Vol 10 (4) ◽  
pp. 044016 ◽  
Author(s):  
Chia-Sheng Chou ◽  
Ray-Kuang Lee ◽  
Peng-Chun Peng ◽  
Hao-chung Kuo ◽  
Gray Lin ◽  
...  
Keyword(s):  
Simple Model ◽  
Cavity Surface ◽  
Surface Emission ◽  
Vertical Cavity Surface ◽  
Vertical Cavity

scholarly journals Ширина линии излучения и alpha-фактор одномодовых вертикально-излучающих лазеров спектрального диапазона 850 нм на основе квантовых ям InGaAs/AlGaAs -=SUP=-*-=/SUP=-

2018 ◽  
Vol 52 (1) ◽  
pp. 98
Author(s):  
С.А. Блохин ◽  
М.А. Бобров ◽  
А.А. Блохин ◽  
А.Г. Кузьменков ◽  
А.П. Васильев ◽  
...  
Keyword(s):  
Quantum Wells ◽  
Emission Line ◽  
Output Power ◽  
Single Mode ◽  
Cavity Surface ◽  
Optical Output ◽  
Surface Emitting Lasers ◽  
Vertical Cavity Surface ◽  
Emitting Lasers ◽  
Vertical Cavity

AbstractThe emission-line width for 850-nm single-mode vertical-cavity surface-emitting lasers based on InGaAs/AlGaAs quantum wells is studied. The width of the emission line for a laser with a 2-μm oxide current aperture attains it minimum (~110 MHz) at an output power of 0.8 mW. As the optical output power is further increased, anomalous broadening of the emission line is observed; this is apparently caused by an increase in the α-factor as a result of a decrease in the differential gain in the active region under conditions of increased concentration of charge carriers and of high internal optical losses in the microcavity. The α-factor is estimated using two independent methods.

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