Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design

2015 ◽  
Vol E98.C (1) ◽  
pp. 35-44 ◽  
Author(s):  
Korkut Kaan TOKGOZ ◽  
Kimsrun LIM ◽  
Seitarou KAWAI ◽  
Nurul FAJRI ◽  
Kenichi OKADA ◽  
...  
Keyword(s):  
Transmission Line ◽  
Millimeter Wave ◽  
Circuit Design ◽  
Cmos Circuit

CMOS Circuit Design Techniques for Millimeter-wave Applications

2009 ◽  
Author(s):  
R. Fujimoto ◽  
T. Mitomo ◽  
H. Hoshino ◽  
Y. Yoshihara
Keyword(s):  
Millimeter Wave ◽  
Circuit Design ◽  
Cmos Circuit ◽  
Design Techniques

A Characterization Method of On-Chip Tee-Junction for Millimeter-Wave CMOS Circuit Design

2014 ◽  
Author(s):  
K.K. Tokgoz ◽  
N. Fajri ◽  
Y. Seo ◽  
S. Kawai ◽  
K. Okada ◽  
...  
Keyword(s):  
Millimeter Wave ◽  
Circuit Design ◽  
Cmos Circuit ◽  
Tee Junction ◽  
On Chip

Evaluation of a Multi-Line De-Embedding Technique up to 110 GHz for Millimeter-Wave CMOS Circuit Design

2010 ◽  
Vol E93-A (2) ◽  
pp. 431-439 ◽  
Author(s):  
Ning LI ◽  
Kota MATSUSHITA ◽  
Naoki TAKAYAMA ◽  
Shogo ITO ◽  
Kenichi OKADA ◽  
...  
Keyword(s):  
Millimeter Wave ◽  
Circuit Design ◽  
Cmos Circuit ◽  
Embedding Technique

Millimeter-wave CMOS circuit design

2005 ◽  
Vol 53 (2) ◽  
pp. 472-477 ◽  
Author(s):  
H. Shigematsu ◽  
T. Hirose ◽  
F. Brewer ◽  
M. Rodwell
Keyword(s):  
Millimeter Wave ◽  
Circuit Design ◽  
Cmos Circuit

Characterization of integrated antennas at millimeter-wave frequencies

2011 ◽  
Vol 4 (1) ◽  
pp. 15-22 ◽  
Author(s):  
Yan Fu ◽  
Laurent Dussopt ◽  
Tan Phu Vuong ◽  
Fabien Ndagijimana
Keyword(s):  
Transmission Line ◽  
Millimeter Wave ◽  
Integrated Antennas ◽  
Angular Sector ◽  
Further Development ◽  
Feeding Techniques

This paper presents two feeding techniques for the radiation characterization of integrated antennas at millimeter-wave frequencies. The first method involves feeding the antenna-under-test (AUT) with a radiofrequency (RF) probe. We compare the measurements obtained with a standard RF probe, an extended probe, and an extended probe with reversed connector orientation. We find that the reversed orientation probe produces the best results in terms of effective measurement angular sector and reduction of ripples due to diffraction. The second method involves feeding the AUT through a flexible transmission line. This method achieves a larger range of measurement angles, but still suffers from parasitic scattering likely due to the mounting bracket and still need further development.

Accurate Transistor Modeling by Three-Parameter Pad Model for Millimeter-Wave CMOS Circuit Design

2016 ◽  
Vol 64 (6) ◽  
pp. 1736-1744 ◽  
Author(s):  
Seitaro Kawai ◽  
Shinji Sato ◽  
Shotaro Maki ◽  
Korkut Kaan Tokgoz ◽  
Kenichi Okada ◽  
...  
Keyword(s):  
Millimeter Wave ◽  
Circuit Design ◽  
Cmos Circuit
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