scholarly journals HS Cal software for the calibration of the Hargreaves-Samani equation

Author(s):  
Lucas Borges Ferreira ◽  
Fernando França da Cunha ◽  
Gilberto Chohaku Sediyama ◽  
Flavio Bastos Campos
Keyword(s):  

Abstract: The objective of this work was to develop a software (HS Cal) to calibrate the Hargreaves-Samani equation for specific periods of the year, in global, seasonal, and monthly time scales, as well as to compare the performance of calibrated and non-calibrated equations. The software was developed in order to use raw data provided by Banco de Dados Meteorológicos para Ensino e Pesquisa (BDMEP). All calibrations outperformed the original Hargreaves-Samani equation, especially with the use of seasonal and monthly calibrations. The HS Cal software can easily calibrate the Hargreaves-Samani equation, allowing the identification of the best form of this equation for a given site.

Author(s):  
James B. Pawley

Past: In 1960 Thornley published the first description of SEM studies carried out at low beam voltage (LVSEM, 1-5 kV). The aim was to reduce charging on insulators but increased contrast and difficulties with low beam current and frozen biological specimens were also noted. These disadvantages prevented widespread use of LVSEM except by a few enthusiasts such as Boyde. An exception was its use in connection with studies in which biological specimens were dissected in the SEM as this process destroyed the conducting films and produced charging unless LVSEM was used.In the 1980’s field emission (FE) SEM’s came into more common use. The high brightness and smaller energy spread characteristic of the FE-SEM’s greatly reduced the practical resolution penalty associated with LVSEM and the number of investigators taking advantage of the technique rapidly expanded; led by those studying semiconductors. In semiconductor research, the SEM is used to measure the line-width of the deposited metal conductors and of the features of the photo-resist used to form them. In addition, the SEM is used to measure the surface potentials of operating circuits with sub-micrometer resolution and on pico-second time scales. Because high beam voltages destroy semiconductors by injecting fixed charges into silicon oxide insulators, these studies must be performed using LVSEM where the beam does not penetrate so far.


1962 ◽  
Vol 17 (9) ◽  
pp. 657-658 ◽  
Author(s):  
Leroy Wolins
Keyword(s):  

2013 ◽  
Vol 40 (3) ◽  
pp. 185-203
Author(s):  
Dhahri Maher ◽  
Bellakhel Ghazi ◽  
Chahed Jamel

Author(s):  
Joe H. Chow ◽  
Petar V. Kokotovic
Keyword(s):  

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