Mechanical and Fracture Properties of Dynamically Cross-Linked Polymer Networks

2017 ◽  
Vol 73 (9) ◽  
pp. P-342-P-347
Author(s):  
KOICHI MAYUMI
1997 ◽  
Vol 473 ◽  
Author(s):  
David R. Clarke

ABSTRACTAs in other engineered structures, fracture occasionally occurs in integrated microelectronic circuits. Fracture can take a number of forms including voiding of metallic interconnect lines, decohesion of interfaces, and stress-induced microcracking of thin films. The characteristic feature that distinguishes such fracture phenomena from similar behaviors in other engineered structures is the length scales involved, typically micron and sub-micron. This length scale necessitates new techniques for measuring mechanical and fracture properties. In this work, we describe non-contact optical techniques for probing strains and a microscopic “decohesion” test for measuring interface fracture resistance in integrated circuits.


JOM ◽  
2015 ◽  
Vol 67 (5) ◽  
pp. 1054-1063 ◽  
Author(s):  
D. G. Sanders ◽  
P. Edwards ◽  
A. M. Cantrell ◽  
K. Gangwar ◽  
M. Ramulu

Author(s):  
Keiichi Shirasu ◽  
Go Yamamoto ◽  
Daniel Nelias ◽  
Toshiyuki Hashida

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