An electrodeposition preconcentration technique was used in conjunction with total reflection x-ray fluorescence (TRXRF) analysis. Enhancement in sensitivity on the order of 103 was realized for the ions investigated here. In addition, x-ray scattering was reduced and a degree of selectivity was achieved by the electrodeposition. The results suggest that trace elemental analysis (sub-ppb level) with chemical speciation capability is feasible by using TRXRF with a conventional x-ray source.