Application of total reflection X-ray fluorescence spectrometry for trace elemental analysis of rainwater

Pramana ◽  
2011 ◽  
Vol 76 (2) ◽  
pp. 361-366 ◽  
Author(s):  
SANGITA DHARA ◽  
N L MISRA
Keyword(s):  
Elemental Analysis ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
Trace Elemental Analysis ◽  
X Ray ◽  
Trace Elemental

scholarly journals Trace Elemental Analysis of Illicit Methamphetamines Using Total Reflection X-Ray Fluorescence Spectroscopy

1999 ◽  
Vol 45 (3) ◽  
pp. 166-171 ◽  
Author(s):  
Seiji Muratsu ◽  
Sadao Fukui ◽  
Toyonaga Maeda ◽  
Tohru Matsushita ◽  
Hiromu Hasegawa ◽  
...  
Keyword(s):  
Fluorescence Spectroscopy ◽  
Elemental Analysis ◽  
Total Reflection ◽  
Trace Elemental Analysis ◽  
X Ray ◽  
Trace Elemental

Enhancement of Total Reflection X-Ray Fluorescence Spectroscopy with Electrochemical Deposition

1993 ◽  
Vol 47 (11) ◽  
pp. 1742-1746 ◽  
Author(s):  
Qiang Fan ◽  
Yohich Gohshi
Keyword(s):  
Fluorescence Spectroscopy ◽  
Electrochemical Deposition ◽  
Elemental Analysis ◽  
Chemical Speciation ◽  
Total Reflection ◽  
Trace Elemental Analysis ◽  
X Ray ◽  
X Ray Scattering ◽  
Preconcentration Technique ◽  
Trace Elemental

An electrodeposition preconcentration technique was used in conjunction with total reflection x-ray fluorescence (TRXRF) analysis. Enhancement in sensitivity on the order of 103 was realized for the ions investigated here. In addition, x-ray scattering was reduced and a degree of selectivity was achieved by the electrodeposition. The results suggest that trace elemental analysis (sub-ppb level) with chemical speciation capability is feasible by using TRXRF with a conventional x-ray source.

Vapor phase treatment–total reflection X-ray fluorescence for trace elemental analysis of silicon wafer surface

2013 ◽  
Vol 90 ◽  
pp. 72-82 ◽  
Author(s):  
Hikari Takahara ◽  
Yoshihiro Mori ◽  
Harumi Shibata ◽  
Ayako Shimazaki ◽  
Mohammad B. Shabani ◽  
...  
Keyword(s):  
Silicon Wafer ◽  
Vapor Phase ◽  
Elemental Analysis ◽  
Total Reflection ◽  
Wafer Surface ◽  
Trace Elemental Analysis ◽  
X Ray ◽  
Silicon Wafer Surface ◽  
Trace Elemental

Trace Elemental Analysis of Drugs of Abuse Using Synchrotron Radiation Total Reflection X-Ray Fluorescence Analysis (SR-TXRF)

2002 ◽  
Vol 47 (5) ◽  
pp. 15500J ◽  
Author(s):  
Seiji Muratsu ◽  
Toshio Ninomiya ◽  
Yasushi Kagoshima ◽  
Junji Matsui
Keyword(s):  
Synchrotron Radiation ◽  
Elemental Analysis ◽  
Drugs Of Abuse ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Trace Elemental Analysis ◽  
X Ray ◽  
Trace Elemental

The use of Si carriers for aerosol particle collection and subsequent elemental analysis by total-reflection X-ray fluorescence spectrometry

2003 ◽  
Vol 58 (12) ◽  
pp. 2145-2155 ◽  
Author(s):  
F Esaka ◽  
K Watanabe ◽  
T Onodera ◽  
T Taguchi ◽  
M Magara ◽  
...  
Keyword(s):  
Aerosol Particle ◽  
Elemental Analysis ◽  
Total Reflection ◽  
Fluorescence Spectrometry ◽  
X Ray ◽  
Particle Collection
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