silicon wafer surface
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scholarly journals Influence of silicon wafer surface roughness on semiconductor device characteristics

2020 ◽  
Vol 59 (SM) ◽  
pp. SMMB06
Author(s):  
Keiichiro Mori ◽  
Shuichi Samata ◽  
Noritomo Mitsugi ◽  
Akinobu Teramoto ◽  
Rihito Kuroda ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Silicon Wafer ◽  
Semiconductor Device ◽  
Wafer Surface ◽  
Silicon Wafer Surface

Self-organized fractal-like structures formation on the silicon wafer surface using the femtosecond laser pulses

2020 ◽  
Vol 128 ◽  
pp. 106008
Author(s):  
R. Goodarzi ◽  
F. Hajiesmaeilbaigi ◽  
E. Bostandoost
Keyword(s):  
Femtosecond Laser ◽  
Silicon Wafer ◽  
Laser Pulses ◽  
Femtosecond Laser Pulses ◽  
Wafer Surface ◽  
Self Organized ◽  
Silicon Wafer Surface

Alumina film deposited by spin-coating method for silicon wafer surface passivation

2020 ◽  
Vol 31 (3) ◽  
pp. 2686-2690 ◽  
Author(s):  
Liqi Cao ◽  
Ning Yang ◽  
Shizheng Li ◽  
Xiaojun Ye ◽  
Xiao Yuan ◽  
...  
Keyword(s):  
Silicon Wafer ◽  
Spin Coating ◽  
Surface Passivation ◽  
Wafer Surface ◽  
Alumina Film ◽  
Spin Coating Method ◽  
Silicon Wafer Surface ◽  
Coating Method

Impact of fabrication of pyramidal structure on silicon wafer surface in ZnO/Si heterojunction

2020 ◽  
Author(s):  
Manju Rani ◽  
Jyoti Kashyap ◽  
Udaibir Singh ◽  
Avinashi Kapoor
Keyword(s):  
Silicon Wafer ◽  
Wafer Surface ◽  
Pyramidal Structure ◽  
Silicon Wafer Surface

Impact of Thermal Processing on Silicon Wafer Surface Roughness

2019 ◽  
Vol 16 (8) ◽  
pp. 401-405 ◽  
Author(s):  
Larry W. Shive ◽  
Brian L. Gilmore
Keyword(s):  
Surface Roughness ◽  
Silicon Wafer ◽  
Thermal Processing ◽  
Wafer Surface ◽  
Silicon Wafer Surface

Development of extreme microanalysis technology for metallic impurity on a silicon wafer surface

2018 ◽  
Author(s):  
Syuhei Yonezawa ◽  
Kazuya Dobashi ◽  
Shigeyuki ◽  
Iwai ◽  
Tatsuya Ichinose ◽  
...  
Keyword(s):  
Silicon Wafer ◽  
Metallic Impurity ◽  
Wafer Surface ◽  
Silicon Wafer Surface

Silicon Wafer Surface Reflectance Investigations by Using Different Surface Texturing Parameters

2017 ◽  
Vol 88 (4) ◽  
pp. 617-623 ◽  
Author(s):  
Girija Moona ◽  
Pankaj Kapruwan ◽  
Rina Sharma ◽  
V. N. Ojha
Keyword(s):  
Silicon Wafer ◽  
Surface Texturing ◽  
Wafer Surface ◽  
Surface Reflectance ◽  
Silicon Wafer Surface
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