Phone Aware Nearest Neighbor Technique Using Spectral Transition Measure for Non-Parallel Voice Conversion

Author(s):  
Nirmesh J. Shah ◽  
Hemant A. Patil
2017 ◽  
Vol 10 (1) ◽  
pp. 114-119
Author(s):  
K Geetha ◽  
R Vadivel

Process of identifying the end points of the acoustic units of the speech signal is called speech segmentation. Speech recognition systems can be designed using sub-word unit like phoneme. A Phoneme is the smallest unit of the language. It is context dependent and tedious to find the boundary. Automated phoneme segmentation is carried in researches using Short term Energy, Convex hull, Formant, Spectral Transition Measure(STM), Group Delay Functions, Bayesian Information Criterion, etc. In this research work, STM is used to find the phoneme boundary of Tamil speech utterances. Tamil spoken word dataset was prepared with 30 words uttered by 4 native speakers with a high quality microphone. The performance of the segmentation is analysed and results are presented.


Author(s):  
J. M. Oblak ◽  
W. H. Rand

The energy of an a/2 <110> shear antiphase. boundary in the Ll2 expected to be at a minimum on {100} cube planes because here strue ture is there is no violation of nearest-neighbor order. The latter however does involve the disruption of second nearest neighbors. It has been suggested that cross slip of paired a/2 <110> dislocations from octahedral onto cube planes is an important dislocation trapping mechanism in Ni3Al; furthermore, slip traces consistent with cube slip are observed above 920°K.Due to the high energy of the {111} antiphase boundary (> 200 mJ/m2), paired a/2 <110> dislocations are tightly constricted on the octahedral plane and cannot be individually resolved.


Author(s):  
S. R. Herd ◽  
P. Chaudhari

Electron diffraction and direct transmission have been used extensively to study the local atomic arrangement in amorphous solids and in particular Ge. Nearest neighbor distances had been calculated from E.D. profiles and the results have been interpreted in terms of the microcrystalline or the random network models. Direct transmission electron microscopy appears the most direct and accurate method to resolve this issue since the spacial resolution of the better instruments are of the order of 3Å. In particular the tilted beam interference method is used regularly to show fringes corresponding to 1.5 to 3Å lattice planes in crystals as resolution tests.


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