scholarly journals X-ray inspection systems for electronic parts

2018 ◽  
Vol 28 (4) ◽  
pp. 52-58
Author(s):  
A. O. Ustinov
Keyword(s):  
Reading Speed ◽  
Inspection System ◽  
Non Destructive Testing ◽  
Electronic Components ◽  
Flat Panel ◽  
Destructive Testing ◽  
X Ray ◽  
Flat Panel Detector ◽  
Cmos Sensor ◽  
Non Destructive

An X-ray inspection is one of the basic methods of non-destructive testing along with optical inspection. Lack of Russian manufacturers in this sector of measuring equipment was a barrier for implementation of the State program «Development of the electronics and radio electronics industry, 2013–2025». High sensitivity X-ray flat panel detector and inspection system concept for non-destructive testing of electronic components were developed. The detector is based on CMOS sensor with pixel pitch 50 um. Key features of the flat panel detector are: limiting spatial resolution 10 LP/mm, reading speed 30 fps, anode voltage range from 20 to 300 kV. Availability of technologies for the production of microfocus sources and flat panel detectors allows creating X-ray inspection system for electronic components for the needs of the microelectronics industry.

scholarly journals A Method for Automated Control of Electronic Components on Microfocus X-ray Images

2021 ◽  
Vol 24 (4) ◽  
pp. 27-36
Author(s):  
N. E. Staroverov
Keyword(s):  
Object Recognition ◽  
Average Error ◽  
Non Destructive Testing ◽  
Electronic Components ◽  
Destructive Testing ◽  
Automated Control ◽  
X Ray ◽  
Radiographic Inspection ◽  
Non Destructive

Introduction. Machine vision systems are increasingly used in industrial production, particularly for monitoring the quality of electronic components. Radiographic (Х-ray) inspection is currently one of the most popular types of non-destructive testing. Electronic components are typically characterized by a small size, hence, their radiographic inspection should be based on obtaining images and their further enlargement. X-ray equipment for performing such studies is designed such that there are relatively small input doses of X-ray radiation in the plane of the receiver, which leads to a higher image noise than that using conventional X-ray devices.Aim. To develop a method for automated object recognition on microfocus X-ray images.Materials and methods. A method for segmentation of X-ray images is proposed. In the first step, adaptive median filtering is performed followed by correction of the image background by subtracting the distorting function. Next, the contours of the objects in the image are identified using the Canny edge detector followed by recognition of the objects on the resulting image.Results. The developed method was tested for quality control of the installation of microcircuits and for determining the number of electronic components. The experiments confirmed the accuracy of the proposed method. When monitoring the quality of microcircuit installation, the number of detected defects differed from that verified by the operator by less than 10 %. The average error of the proposed method was less than 0.1% when determining the number of electronic components.Conclusion. The proposed method for object recognition on microfocus X-ray images demonstrated sufficient accuracy in typical tasks of non-destructive testing of electronic components.

scholarly journals ABOUT TECHNOLOGIES OF X-RAY SYSTEMS FOR CONTROL OF ELECTRONIC COMPONENTS

2019 ◽  
Vol 22 (3) ◽  
pp. 113-121
Author(s):  
Anatoly I. Mazurov ◽  
Nikolay N. Potrakhov
Keyword(s):  
Focal Length ◽  
Inspection System ◽  
Electronic Components ◽  
Destructive Testing ◽  
X Ray ◽  
Advantages And Disadvantages ◽  
Pumping System ◽  
Inspection Systems ◽  
The Cost ◽  
Non Destructive

Introduction. X-ray methods are currently widely used in manufacturing of various products and components of the electronics industry, including micro- and nano-electronics. One of the most informative and illustrative methods is projection X-ray microscopy. Specialized X-ray systems for process control are developed and used in industry. The key element in the design of an X-ray inspection system is an X-ray tube. In the overwhelming majority of cases, X-ray inspection systems are based on collapsible microfocus x-ray tubes with constant pumping. This greatly complicates the design of the installation, increases its dimensions, weight and cost. Objective. Analysis of possible technical and technological solutions that improve the availability of the X-ray system for monitoring of electronic components while maintaining the information content of the control. Materials and methods. The article presents the results of analytical studies of assessment of the degree of influence of the main parameters of the X-ray tube – the size of the focal spot and the focal length – on the resolution of the resulting X-ray images. The advantages and disadvantages of two variants of the construction of the X-ray inspection systems are described: based on collapsible and based on sealed X-ray tubes. The dependence of the size of the focal spot on the voltage on the X-ray tube and on the power supplied by the electron beam to the target of the X-ray tube is analyzed. It is shown that sealed (from a vacuum pumping system) micro focus X-ray tubes can be successfully used as a radiation source in installations for X-ray inspection. It is concluded that in most cases, sealed tubes are more practical. Results. In solving of most problems of non-destructive testing of electronic components in the composition of the Xray system, X-ray sources based on sealed X-ray tubes can be successfully used. Due to this, dimensions, weight, and the cost of an X-ray system for monitoring of electronic components are substantially reduced. Conclusion. Sealed X-ray tubes are an effective alternative in the development of an X-ray system for monitoring of electronic components, which enables to fundamentally increase the availability of such a system.

X-ray non-destructive testing – an essential tool during modern aeronautics material technology design and development

2019 ◽  
pp. 213-224
Author(s):  
O. G. Ospennikova ◽  
E. I. Kosarina ◽  
O. A. Krupnina
Keyword(s):  
Radiation Detector ◽  
Theoretical Estimate ◽  
Image Formation ◽  
Optical Image ◽  
Inspection System ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
X Ray ◽  
Object Of Control ◽  
Non Destructive

The X-ray non-destructive testing process is carried out by the system, which includes: the object of control (OC); source of radiation; detector; operator. The X-ray radiation and the object of control interaction formed the radiation image as X-ray doze distribution in accordance with the properties of the OC. At this stage, useful information about the OK is formed, which one is partially lost, partially distorted, and veiled with noise when the radiation image is converted into an optical one. The optical image is analyzed by operator, and the result of the control depends from his physical and emotional state.This article presents a phased analysis of the entire radiation monitoring system. The first stage is the radiation image formation. Theoretical estimate of X-ray inspection system minimum detected defect size was made using space frequency spectrum analysis. The second stage is the transformation of the radiation image into an optical one. We represented the simulation of this process and obtained a modulation of how the operator sees the X-ray optical image and makes a decision about the OC state. Analyzed the X-ray digital image formation and determined the energy choice criteria when applied digital radiography.

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