Evaluation of Rare-earth-based Coated Conductors

Epitaxial films of rare-earth (RE = La, Ce, Eu, and Gd) tantalates, RE3TaO7 with pyrochlore structures were grown on biaxially textured nickel-3 at.% tungsten (Ni-W) substrates using chemical solution deposition (CSD) process. Precursor solution of 0.3∼0.4 M concentration of total cations were spin coated on to short samples of Ni-W substrates and the films were crystallized at 1050∼1100 °C in a gas mixture of Ar- 4% H2 for 15 to 60 min. X-ray studies show that the films of pyrochlore RE tantalate films are highly textured with cube-on-cube epitaxy. Improved texture was observed in case of lanthanum tantalate (La3TaO7) film grown on Ni-W substrates. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) investigations of RE3TaO7 films reveal a fairly dense and smooth microstructure without cracks and porosity. The rare-earth tantalate layers may be potentially used as buffer layers for YBa2Cu3O7-δ (YBCO) coated conductors.

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Growth of rare-earth niobate-based pyrochlores on textured Ni–W substrates with ionic radii dependency

Journal of Materials Research ◽

10.1557/jmr.2005.0110 ◽

2005 ◽

Vol 20 (4) ◽

pp. 904-909 ◽

Cited By ~ 12

Author(s):

M.S. Bhuiyan ◽

M. Paranthaman ◽

S. Sathyamurthy ◽

A. Goyal ◽

K. Salama

Keyword(s):

Rare Earth ◽

Ionic Radius ◽

Pyrochlore Structure ◽

Precursor Solution ◽

Deposition Process ◽

Coated Conductors ◽

Buffer Layers ◽

Ionic Radii ◽

Solution Deposition ◽

Force Microscopy

Epitaxial films of rare-earth (RE) niobates, RE3NbO7 with pyrochlore structures, were grown on biaxially textured nickel–3 at.% tungsten (Ni–W) substrates using a chemical solution deposition process. A precursor solution of 0.3–0.50 M concentration of total cations was spin coated on to short samples of Ni–W substrates, and the films were crystallized at 1050–1100 °C in a gas mixture of Ar–4% H2 for 15 min. Detailed studies revealed that RE-niobates with ionic radius ratio RRE/RNb (R = ionic radius) from 1.23 to 1.40 (i.e., Sm, Eu, Gd, Ho, Y, and Yb) grow epitaxially with the pyrochlore structure. X-ray studies showed that the films of pyrochlore RE niobate films were highly textured with cube-on-cube epitaxy. Scanning electron and atomic force microscopy investigations of RE3NbO7 films revealed a fairly dense and smooth microstructure without cracks and porosity. The rare-earth niobate layers may be potentially used as buffer layers for YBa2Cu3O7−δ coated conductors.

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Rare-earth mixed oxide thin films as 100% lattice match buffer layers for YBa2Cu3O7−x coated conductors

Thin Solid Films ◽

10.1016/j.tsf.2010.01.002 ◽

2010 ◽

Vol 518 (12) ◽

pp. 3345-3350 ◽

Cited By ~ 15

Author(s):

L. Arda ◽

Z.K. Heiba

Keyword(s):

Thin Films ◽

Rare Earth ◽

Mixed Oxide ◽

Coated Conductors ◽

Buffer Layers ◽

Oxide Thin Films ◽

Lattice Match

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Post-processing method for extracting the resistivity of Rare-Earth Barium Copper Oxide (REBCO) coated conductors in over-critical current conditions from ultra-fast V-I pulsed current measurements

Journal of Applied Physics ◽

10.1063/1.5095637 ◽

2019 ◽

Vol 126 (2) ◽

pp. 023902 ◽

Cited By ~ 1

Author(s):

S. Richard ◽

F. Sirois ◽

C. Lacroix

Keyword(s):

Rare Earth ◽

Copper Oxide ◽

Critical Current ◽

Barium Copper Oxide ◽

Processing Method ◽

Coated Conductors ◽

Pulsed Current ◽

Post Processing ◽

Barium Copper

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Microstructural evolution and its influence on oxygen diffusion in yttrium-doped ceria thin films

Materials Research Express ◽

10.1088/2053-1591/ac3952 ◽

2021 ◽

Author(s):

Jinzhan Li ◽

Li Lei ◽

Limin Li ◽

Bo Deng ◽

Gaoyang Zhao ◽

...

Keyword(s):

Thin Films ◽

Rare Earth ◽

Solid Oxide Fuel Cells ◽

Oxygen Diffusion ◽

Oxygen Vacancies ◽

Fluorite Structure ◽

Rare Earth Ions ◽

Coated Conductors ◽

Buffer Layers ◽

Silicon Substrates

Abstract Ceria doped with rare earth ions (Ce1-xMxO2-y (y=x/2)), which contain many oxygen vacancies, have become excellent electrolyte materials for solid oxide fuel cells and important buffer layers for coated conductors. In this paper, Y3+ ions were doped into the lattice of CeO2 to form Ce1-xYxO2-y (CYO) thin films regarded as buffer layers to reduce oxygen diffusion on silicon substrates. It was revealed that the CYO films gradually transformed from a complete fluorite structure into a defective fluorite structure with more and more oxygen vacancies as the proportion of Y3+ ions in CYO films increased from zero, and then the defective fluorite structure transformed into rare earth C-type structure when the proportion of Y3+ ions was beyond 0.5. Moreover, at the beginning, the degree of oxygen diffusion showed an uptrend, but after the proportion of Y3+ ions reached a certain value, the degree of oxygen diffusion turned into a downtrend.

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