Multi-Objective Optimization for Enhancing System Coordination Restoration by Placement of Fault Current Limiters on an Active Distribution System with System Reliability Considerations

2018 ◽  
Author(s):  
Rachawadee Puangsukra ◽  
Jai Govind Singh ◽  
Weerakorn Ongsakul ◽  
Francisco M. Gonzalez-Longatt
Keyword(s):  
System Reliability ◽  
Distribution System ◽  
Fault Current ◽  
Multi Objective Optimization ◽  
Multi Objective ◽  
Active Distribution System ◽  
Fault Current Limiters

Multi-objective optimization of optimal capacitor allocation in radial distribution systems

2020 ◽  
Vol 21 (3) ◽  
Author(s):  
Sayed Mir Shah Danish ◽  
Mikaeel Ahmadi ◽  
Atsushi Yona ◽  
Tomonobu Senjyu ◽  
Narayanan Krishna ◽  
...  
Keyword(s):  
Radial Distribution ◽  
Distribution System ◽  
Distribution Systems ◽  
Reactive Power ◽  
Stability Index ◽  
Distribution Networks ◽  
Optimization Method ◽  
Optimal Size ◽  
Multi Objective Optimization ◽  
Multi Objective

AbstractThe optimal size and location of the compensator in the distribution system play a significant role in minimizing the energy loss and the cost of reactive power compensation. This article introduces an efficient heuristic-based approach to assign static shunt capacitors along radial distribution networks using multi-objective optimization method. A new objective function different from literature is adapted to enhance the overall system voltage stability index, minimize power loss, and to achieve maximum net yearly savings. However, the capacitor sizes are assumed as discrete known variables, which are to be placed on the buses such that it reduces the losses of the distribution system to a minimum. Load sensitive factor (LSF) has been used to predict the most effective buses as the best place for installing compensator devices. IEEE 34-bus and 118-bus test distribution systems are utilized to validate and demonstrate the applicability of the proposed method. The simulation results obtained are compared with previous methods reported in the literature and found to be encouraging.

scholarly journals Design and computational modeling of fault current limiter topologies

2020 ◽  
Author(s):  
Alexandre Bitencourt ◽  
Daniel H. N. Dias ◽  
Bruno W. França ◽  
Felipe Sass ◽  
Guilherme G. Sotelo
Keyword(s):  
Electric Power ◽  
Distributed Generation ◽  
Distribution System ◽  
Short Circuit ◽  
Short Circuit Current ◽  
Economic Feasibility ◽  
Fault Current ◽  
Fault Current Limiter ◽  
Fault Current Limiters ◽  
Current Limiter

The increase in demand for electric power and the insertion of a distributed generation led to the rise of the short-circuit current in substations. Most of these Brazilian substations were designed decades ago, because of that their equipment may not support the new short-circuit current levels. To protect the installed equipment and avoid excessive costs replacing old devices, it is possible to install Fault Current Limiters (FCLs). This document is a report from an R&D project that evaluated FCL topologies considering real parameters in simulation from used equipment, concluding that the selected FCL topologies accomplished their technical objective. However, before implementing these topologies in the distribution system, one should consider the technical and economic feasibility of using semiconductor switching devices.

Research on the Multi-Objective Optimization Model of System-Level BIT Testability Index Determination

2011 ◽  
Vol 121-126 ◽  
pp. 2223-2227 ◽  
Author(s):  
Chun Sheng Zhu ◽  
Qi Zhang ◽  
Fan Tun Su ◽  
Hong Liang Ran
Keyword(s):  
Genetic Algorithm ◽  
Life Cycle ◽  
Mathematical Models ◽  
Optimization Model ◽  
System Reliability ◽  
Life Cycle Cost ◽  
System Level ◽  
Multi Objective Optimization ◽  
Multi Objective ◽  
Life Circle

By weighing reliability, maintainability, availability and life-cycle cost of equipment which are influenced by testability，the testability indexes of system level BIT are determined on the basis of maximum system reliability & maintainability and minimum the life-circle cost. The influence mathematical models of system reliability, maintainability, availability and life-circle cost are established. According to these mathematical models, the multi-objective optimization model of system-level BIT testability indexes is established. The multi-objective optimization model is solved using Non-dominated Sorting Genetic Algorithm II, and the validity of the multi-objective optimization model is proved through an example.

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