Application specified soft-error failure rate analysis using sequential equivalence checking techniques

Tsinghua Science & Technology ◽

10.26599/tst.2018.9010136 ◽

2020 ◽

Vol 25 (1) ◽

pp. 103-116

Author(s):

Tun Li ◽

Qinhan Yu ◽

Hai Wan ◽

Sikun Li

Keyword(s):

Failure Rate ◽

Equivalence Checking ◽

Rate Analysis ◽

Sequential Equivalence Checking

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Application specified soft error failure rate analysis using sequential equivalence checking techniques

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2013.6509665 ◽

2013 ◽

Author(s):

Tun Li ◽

Dan Zhu ◽

Sikun Li ◽

Yang Guo

Keyword(s):

Failure Rate ◽

Equivalence Checking ◽

Rate Analysis ◽

Sequential Equivalence Checking

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Soft-error induced system-failure rate analysis in an SoC

Norchip 2007 ◽

10.1109/norchp.2007.4481075 ◽

2007 ◽

Author(s):

S.M. Tony ◽

H. Mohammad ◽

J. Mathew ◽

D. K. Pradhan

Keyword(s):

Failure Rate ◽

System Failure ◽

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Reliability of reinforced concrete beams in limit state of cracking— failure rate analysis approach

Matériaux et Constructions ◽

10.1007/bf02472559 ◽

1989 ◽

Vol 22 (4) ◽

pp. 269-279 ◽

Author(s):

Prakash Desayi ◽

K. Balaji Rao

Keyword(s):

Reinforced Concrete ◽

Failure Rate ◽

Concrete Beams ◽

Limit State ◽

Reinforced Concrete Beams ◽

Analysis Approach ◽

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Sufficiency-based filtering of invariants for Sequential Equivalence Checking

2011 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2011.6114159 ◽

2011 ◽

Author(s):

Wei Hu ◽

Huy Nguyen ◽

Michael S. Hsiao

Keyword(s):

Equivalence Checking ◽

Sequential Equivalence Checking

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Mining Complex Boolean Expressions for Sequential Equivalence Checking

2010 19th IEEE Asian Test Symposium ◽

10.1109/ats.2010.81 ◽

2010 ◽

Author(s):

Neha Goel ◽

Michael S. Hsiao ◽

Narendran Ramakrishnan ◽

Mohammed J. Zaki

Keyword(s):

Equivalence Checking ◽

Mining Complex ◽

Sequential Equivalence Checking ◽

Boolean Expressions

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GPU-Accelerated Soft Error Rate Analysis of Large-Scale Integrated Circuits

Soft Error Reliability of VLSI Circuits ◽

10.1007/978-3-030-51610-9_4 ◽

2020 ◽

pp. 45-54

Author(s):

Behnam Ghavami ◽

Mohsen Raji

Keyword(s):

Integrated Circuits ◽

Large Scale ◽

Soft Error Rate ◽

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Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection

IEEE Design and Test ◽

10.1109/mdt.2012.2194471 ◽

2013 ◽

Vol 30 (2) ◽

pp. 77-86 ◽

Author(s):

Hsuan-Ming Huang ◽

C. H-P Wen

Keyword(s):

Charge Collection ◽

Full Spectrum ◽

Soft Error Rate ◽

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Sequential equivalence checking based on structural similarities

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.851997 ◽

2000 ◽

Vol 19 (7) ◽

pp. 814-819 ◽

Author(s):

C.A.J. van Eijk

Keyword(s):

Equivalence Checking ◽

Sequential Equivalence Checking

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Sequential Equivalence Checking by Symbolic Simulation

Formal Methods in Computer-Aided Design - Lecture Notes in Computer Science ◽

10.1007/3-540-40922-x_26 ◽

2000 ◽

pp. 460-479 ◽

Author(s):

Gerd Ritter

Keyword(s):

Equivalence Checking ◽

Symbolic Simulation ◽

Sequential Equivalence Checking

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Sequential equivalence checking

19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) ◽

10.1109/vlsid.2006.145 ◽

2006 ◽

Author(s):

A. Mathur ◽

M. Fujita ◽

M. Balakrishnan ◽

R. Mitra

Keyword(s):

Equivalence Checking ◽

Sequential Equivalence Checking

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