Uplift Capacity of Pile Groups Embedded in Sands: Predictions and Performance

Experimental investigations on model vertical and batter pile group in uniform sands are presented. Mild steel piles in two different medium ofsand are used in this investigation. The tests are conducted on model steel pile installed in medium, and dense sand withL/d ratio is 18.75 and different batter angles of 0°, 10°, 20°, and 30°. These piles are constructed in sand and subjected to uplift loads of 60° inclination. It was found that the uplift capacity of vertical and batter piles under inclined pulls increased with increase in inclination of piles.it is also observed it a negative batter pile has greater uplift load than positive batter pile

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Effect of Arching on Uplift Capacity of Pile Groups in Sand

International Journal of Geomechanics ◽

10.1061/(asce)1532-3641(2008)8:6(347) ◽

2008 ◽

Vol 8 (6) ◽

pp. 347-354 ◽

Cited By ~ 28

Author(s):

A. Shelke ◽

N. R. Patra

Keyword(s):

Uplift Capacity ◽

Pile Groups

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886311 Design and performance of large diameter cast in place pile groups subjected to lateral loads

International Journal of Rock Mechanics and Mining Sciences & Geomechanics Abstracts ◽

10.1016/0148-9062(88)91299-5 ◽

1988 ◽

Vol 25 (6) ◽

pp. 299

Keyword(s):

Large Diameter ◽

Lateral Loads ◽

Pile Groups ◽

And Performance

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Transmission Scanning Electron Microscopy and Energy Analysis with the Siemens ELMISKOP 101

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100095509 ◽

1972 ◽

Vol 30 ◽

pp. 450-451

Author(s):

H. M. Thieringer

Keyword(s):

Objective Lens ◽

Transmission Microscopy ◽

Image Recording ◽

Mode Of Operation ◽

Scanning Transmission ◽

Electron Microscopes ◽

And Performance ◽

Convergent Beam ◽

Ray Path ◽

Beam Diffraction

It has repeatedly been show that with conventional electron microscopes very fine electron probes can be produced, therefore allowing various micro-techniques such as micro recording, X-ray microanalysis and convergent beam diffraction. In this paper the function and performance of an SIEMENS ELMISKOP 101 used as a scanning transmission microscope (STEM) is described. This mode of operation has some advantages over the conventional transmission microscopy (CTEM) especially for the observation of thick specimen, in spite of somewhat longer image recording times.Fig.1 shows schematically the ray path and the additional electronics of an ELMISKOP 101 working as a STEM. With a point-cathode, and using condensor I and the objective lens as a demagnifying system, an electron probe with a half-width ob about 25 Å and a typical current of 5.10-11 amp at 100 kV can be obtained in the back focal plane of the objective lens.

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