ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Electrical Overstress
Mapping Intimacies
◽
10.32388/whczap
◽
2020
◽
Author(s):
Keyword(s):
Electrical Overstress
Download Full-text
Related Documents
Cited By
References
Electrical Overstress Protection of Submicron Devices.
10.21236/ada150334
◽
1984
◽
Author(s):
R. J. Antinone
◽
P. A. Young
Keyword(s):
Submicron Devices
◽
Electrical Overstress
Download Full-text
EOS (Electrical Overstress) Protection for VLSI (Very Large Scale Integration) Devices.
10.21236/ada150333
◽
1984
◽
Author(s):
D. D. Wilson
◽
W. E. Echols
◽
M. G. Rossi
Keyword(s):
Large Scale
◽
Very Large Scale Integration
◽
Large Scale Integration
◽
Electrical Overstress
◽
Scale Integration
Download Full-text
Wiley Series in Electrostatic Discharge ( ESD ) and Electrical Overstress ( EOS )
The ESD Handbook
◽
10.1002/9781119233091.app4
◽
2021
◽
pp. 1055-1056
Keyword(s):
Electrostatic Discharge
◽
Electrical Overstress
Download Full-text
Electrical Overstress / Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)
Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)
◽
10.1109/eosesd.1998.737011
◽
1998
◽
Keyword(s):
Electrostatic Discharge
◽
Electrical Overstress
Download Full-text
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)
◽
10.1109/eosesd.2000.890020
◽
2000
◽
Keyword(s):
Electrostatic Discharge
◽
Electrical Overstress
Download Full-text
Thermal failure simulation for electrical overstress in semiconductor devices
1993 IEEE International Symposium on Circuits and Systems
◽
10.1109/iscas.1993.393991
◽
2002
◽
Cited By ~ 2
Author(s):
C. Diaz
◽
C. Duvvury
◽
S.-M. Kang
Keyword(s):
Semiconductor Devices
◽
Thermal Failure
◽
Failure Simulation
◽
Electrical Overstress
Download Full-text
Electrical overstress failure analysis in microcircuits
Microelectronics Reliability
◽
10.1016/0026-2714(78)90029-x
◽
1978
◽
Vol 18
(6)
◽
pp. 476
Keyword(s):
Failure Analysis
◽
Electrical Overstress
Download Full-text
Electrical Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress
IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
◽
10.1109/iecon.2018.8591088
◽
2018
◽
Cited By ~ 1
Author(s):
Evan Dimech
◽
John Frederick Dawson
Keyword(s):
Electrical Parameters
◽
Electrical Overstress
Download Full-text
System and Component Failure from Electrical Overstress and Electrostatic Discharge
System of System Failures
◽
10.5772/intechopen.72677
◽
2018
◽
Author(s):
Steven H. Voldman
Keyword(s):
Electrostatic Discharge
◽
Component Failure
◽
Electrical Overstress
Download Full-text
Switching Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society
◽
10.1109/iecon.2019.8926643
◽
2019
◽
Author(s):
Evan Dimech
◽
John Frederick Dawson
Keyword(s):
Electrical Overstress
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close