Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)
Latest Publications

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Published By ESD Assoc

1585370185

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Baseline popping of spin-valve recording heads induced by ESD

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890100 ◽

2002 ◽

Author(s):

Yong Shen ◽

R. Leung ◽

J.Z.F. Sun

Keyword(s):

Spin Valve ◽

Recording Heads

Substrate pump NMOS for ESD protection applications

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890022 ◽

2002 ◽

Cited By ~ 45

Author(s):

C. Duvvury ◽

S. Ramaswamy ◽

A. Amerasekera ◽

R.A. Cline ◽

B.H. Andresen ◽

...

Keyword(s):

Esd Protection

Advanced 2D/3D ESD device simulation-a powerful tool already used in a pre-Si phase

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890111 ◽

2002 ◽

Cited By ~ 18

Author(s):

K. Esmark ◽

W. Stadler ◽

M. Wendel ◽

H. Gossner ◽

X. Guggenmos ◽

...

Keyword(s):

Device Simulation

On-chip ESD protection design by using polysilicon diodes in CMOS technology for smart card application

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890086 ◽

2002 ◽

Author(s):

Tai-Ho Wang ◽

Ming-Dou Ker

Keyword(s):

Smart Card ◽

Cmos Technology ◽

Esd Protection ◽

On Chip

Controlling ESD and cleanliness by using new thermoplastic compounds for injection molded and corrugated packaging products

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890037 ◽

2002 ◽

Author(s):

M. Narkis ◽

G. Lidor ◽

A. Vaxman ◽

L. Zuri

Keyword(s):

Injection Molded

Generalized model of electrostatic discharge (ESD) for bodies in approach: analyses of multiple discharges and speed of approach

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890027 ◽

2002 ◽

Cited By ~ 1

Author(s):

W.D. Greason

Keyword(s):

Electrostatic Discharge ◽

Generalized Model

Advances in magneto optical static event detector technology

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890045 ◽

2002 ◽

Author(s):

N. Jacksen ◽

L. Nelsen ◽

D. Boehm ◽

T. Odom

Keyword(s):

Detector Technology

New methods for measuring resistance and charge decay of worksurfaces

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890038 ◽

2002 ◽

Author(s):

H. Uchida ◽

H. Kurosaki ◽

T. Numaguchi

Keyword(s):

New Methods ◽

Charge Decay

Advancements in inherently dissipative polymer (IDP) alloys provide new levels of clean, consistent ESD protection

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890036 ◽

2002 ◽

Author(s):

K.J. Kim ◽

M. Hardwick ◽

H. Pham ◽

T. Fahey

Keyword(s):

Esd Protection

A study of wafer level ESD testing

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) ◽

10.1109/eosesd.2000.890021 ◽

2002 ◽

Author(s):

K. Yokoi ◽

T. Watanabe

Keyword(s):

Wafer Level

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By ESD Assoc

Baseline popping of spin-valve recording heads induced by ESD

Substrate pump NMOS for ESD protection applications

Advanced 2D/3D ESD device simulation-a powerful tool already used in a pre-Si phase

On-chip ESD protection design by using polysilicon diodes in CMOS technology for smart card application

Controlling ESD and cleanliness by using new thermoplastic compounds for injection molded and corrugated packaging products

Generalized model of electrostatic discharge (ESD) for bodies in approach: analyses of multiple discharges and speed of approach

Advances in magneto optical static event detector technology

New methods for measuring resistance and charge decay of worksurfaces

Advancements in inherently dissipative polymer (IDP) alloys provide new levels of clean, consistent ESD protection

A study of wafer level ESD testing

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)
Latest Publications