scholarly journals BLEH: Bit-Less Extendible Hashing for DBMS and Hard Disk Drives

Indexing techniques such as extendible hashing and B-trees are widely used to store, retrieve and search for data on files in most file systems. These techniques have been comprehensively explored to enhance the data structure for increasing the faster access to file contents. Extendible hashing is a dynamic hashing technique which handles dynamic files that keep changing in size. Traditional extendible hashing uses bit addresses to hash the data to buckets and restricts the directory size to be a power of 2 which has corresponding complications in implementation. Restriction on directory size also results in uneven distribution of data which increases the possibility of overflows. This in turn increases the cost of index maintenance. In this paper, an efficient and simpler to implement variation of Extendible hashing method named Bit-Less Extendible Hashing (BLEH) for dynamic files is proposed. The proposed method eliminates the need for binary representation of the hash address which reduces the complexity of implementation. Furthermore, it eliminates the need for the directory size to be a power of 2 providing flexibility in the choice of initial directory size. The experimental results show that the proposed method provides better performance in terms of split count upon insertion when compared to the traditional extendible hashing method with good space utilization.

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 729
Author(s):  
Chanida Puttichaem ◽  
Guilherme P. Souza ◽  
Kurt C. Ruthe ◽  
Kittipong Chainok

A novel, high throughput method to characterize the chemistry of ultra-thin diamond-like carbon films is discussed. The method uses surface sensitive SEM/EDX to provide substrate-specific, semi-quantitative silicon nitride/DLC stack composition of protective films extensively used in the hard disk drives industry and at Angstrom-level. SEM/EDX output is correlated to TEM to provide direct, gauge-capable film thickness information using multiple regression models that make predictions based on film constituents. The best model uses the N/Si ratio in the films, instead of separate Si and N contributions. Topography of substrate/film after undergoing wear is correlatively and compositionally described based on chemical changes detected via the SEM/EDX method without the need for tedious cross-sectional workflows. Wear track regions of the substrate have a film depleted of carbon, as well as Si and N in the most severe cases, also revealing iron oxide formation. Analysis of film composition variations around industry-level thicknesses reveals a complex interplay between oxygen, silicon and nitrogen, which has been reflected mathematically in the regression models, as well as used to provide valuable insights into the as-deposited physics of the film.


2020 ◽  
Vol 248 ◽  
pp. 119216
Author(s):  
Laura Talens Peiró ◽  
Alejandra Castro Girón ◽  
Xavier Gabarrell i Durany

2002 ◽  
Vol 68 (667) ◽  
pp. 720-727 ◽  
Author(s):  
Hiromitsu MASUDA ◽  
Toshihiko SHIMIZU ◽  
Mikio TOKUYAMA ◽  
Haruhide TAKAHASHI ◽  
Kousaku WAKATSUKI ◽  
...  

2012 ◽  
Vol 18 (9-10) ◽  
pp. 1383-1388 ◽  
Author(s):  
Masaru Furukawa ◽  
Junguo Xu ◽  
Jin Liu ◽  
Jianhua Li ◽  
Shoya Nosaki ◽  
...  

2014 ◽  
Vol 50 (11) ◽  
pp. 1-4 ◽  
Author(s):  
Nobumasa Nishiyama ◽  
Yuji Soga ◽  
Kazuniro Nagaoka ◽  
Tomohisa Okada ◽  
John T. Contreras ◽  
...  

2005 ◽  
Vol 38 (1) ◽  
pp. 31-36 ◽  
Author(s):  
Ying Li ◽  
Guoxiao Guo ◽  
Youyi Wang

2009 ◽  
Vol 45 (2) ◽  
pp. 816-821 ◽  
Author(s):  
K. Aoki ◽  
T. Watanabe

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