Lens Surface Distance Measurement with Large Range and High Precision Based on Low Coherence Interferometry

2016 ◽  
Vol 36 (6) ◽  
pp. 0612001
Author(s):  
师中华 Shi Zhonghua ◽  
杨宝喜 Yang Baoxi ◽  
胡小邦 Hu Xiaobang ◽  
金超群 Jin Chaoqun ◽  
魏张帆 Wei Zhangfan ◽  
...  
2018 ◽  
Vol 29 (2) ◽  
pp. 025006 ◽  
Author(s):  
Agustinus Winarno ◽  
Shusei Masuda ◽  
Satoru Takahashi ◽  
Hirokazu Matsumoto ◽  
Kiyoshi Takamasu

Laser Physics ◽  
2018 ◽  
Vol 28 (11) ◽  
pp. 116101 ◽  
Author(s):  
Ankit Butola ◽  
Tilak Joshi ◽  
Azeem Ahmad ◽  
Vishesh Dubey ◽  
P Senthilkumaran ◽  
...  

2017 ◽  
Vol 44 (6) ◽  
pp. 0604002
Author(s):  
金超群 Jin Chaoqun ◽  
杨宝喜 Yang Baoxi ◽  
胡小邦 Hu Xiaobang ◽  
张方 Zhang Fang ◽  
马健 Ma Jian ◽  
...  

Sensors ◽  
2020 ◽  
Vol 20 (4) ◽  
pp. 1168
Author(s):  
Xun Sun ◽  
Kunpeng Feng ◽  
Jiwen Cui ◽  
Hong Dang ◽  
Yizhao Niu ◽  
...  

Micro absolute distance measurement (MADM) is widely used in industrial and military fields. To achieve high accuracy and frequency response, a polarized low-coherence interferometry (PLCI)-based method for MADM is proposed. The nearly linear relationship between the envelope center and m-order PLCI fringe (PLCIF) peak center is found and verified. Dispersion compensation is achieved by fringe peak position estimation and polynomial fitting to get rid of the dependence on an a priori model and birefringence parameters, and make this method very robust. Meanwhile, the zero-order PLCIF center is estimated and located to demodulate the measured displacement. Then, the measurement accuracy is raised by polynomial fittings. In comparison to conventional methods, the proposed method can effectively avoid jump errors and has a higher accuracy. Experimental results indicate that the measurement accuracy is higher than 19.51 nm, the resolution is better than 2 nm, and its processing data rate can reach 35 kHz.


2019 ◽  
Vol 37 (14) ◽  
pp. 3557-3562
Author(s):  
Rundong Wang ◽  
Shuang Wang ◽  
Junfeng Jiang ◽  
Kun Liu ◽  
Xue Wang ◽  
...  

2011 ◽  
Author(s):  
Zdeněk Buchta ◽  
Bretislav Mikel ◽  
Simon Rerucha ◽  
Josef Lazar ◽  
Ondrej Cip

2002 ◽  
Vol 82 (4) ◽  
pp. 2256-2264 ◽  
Author(s):  
Adam Wax ◽  
Changhuei Yang ◽  
Vadim Backman ◽  
Kamran Badizadegan ◽  
Charles W. Boone ◽  
...  

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