Detecting Digital Micromirror Device Malfunctions in High-throughput Maskless Lithography
2013 ◽
Vol 17
(6)
◽
pp. 513-517
◽
Minwook Kang
◽
Dong Won Kang
◽
Jae W. Hahn
E. A. Hakkennes
◽
A. D. Wiersma
◽
M. Hoving
◽
N. Venema
◽
S. Woutersen
◽
...
Yanping He
◽
Yijin Wang
◽
Renjie Zhou
2019 ◽
Vol 185
◽
pp. 1036-1044
◽
Chao Peng
◽
Zezhou Zhang
◽
Jianxiao Zou
◽
Wenming Chi
Tao Wang
◽
Marzia Quaglio
◽
Fabrizio Pirri
◽
Yang-Chun Cheng
◽
David Busacker
◽
...
E. Slot
◽
M. J. Wieland
◽
G. de Boer
◽
P. Kruit
◽
G. F. ten Berge
◽
...
2020 ◽
Vol MA2020-02
(66)
◽
pp. 3359-3359
Ryo Negishi
◽
Hyuga Saito
◽
Tsuyoshi Tanaka
◽
Tomoko Yoshino
M. J. Wieland
◽
G. de Boer
◽
G. F. ten Berge
◽
R. Jager
◽
T. van de Peut
◽
...
M. Fritze
◽
B. Tyrrell
◽
T. Fedynyshyn
◽
M. Rothschild
◽
P. Brooker
2010 ◽
Vol 14
(3)
◽
pp. 266-276
◽
2012 ◽
Vol 16
(3)
◽
pp. 221-227
◽
Jungyu Hur
◽
Manseung Seo