45.5X Infinity Corrected Schwarzschild Microscope Objective Lens Design

Author(s):  
Sami D. Alaruri

In this article, the design of a 45.5X (numerical aperture (NA) =0.5) infinity corrected, or infinite conjugate, Schwarzschild reflective microscope objective lens is discussed. Fast Fourier transform modulation transfer function (FFT MTF= 568.4 lines/mm at 50% contrast for the on-axis field-of-view), root-mean-square wavefront error (RMS WFE= 0.024 waves at 700 nm), point spread function (PSF, Strehl ratio= 0.972), encircled energy (0.88 µm spot radius at 80% fraction of enclosed energy), optical path difference (OPD=-0.644 waves) and Seidel coefficients calculated with Zemax® are provided to show that the design is diffraction-limited and aberration-free. Furthermore, formulas expressing the relationship between the parameters of the two spherical mirrors and the Schwarzschild objective lens focal length are given. In addition, tolerance and sensitivity analysis for the Schwarzschild objective lens, two spherical mirrors indicate that tilting the concave mirror (or secondary mirror) has a higher impact on the modulation transfer function values than tilts introduced by the convex mirror (or primary mirror). Finally, the performed tolerance and sensitivity analysis on the lens design suggests that decentering any of the mirrors by the same distance has the same effect on the modulation transfer function values.

2021 ◽  
Vol 2127 (1) ◽  
pp. 012021
Author(s):  
Yu Yu Kachurin ◽  
A V Kryukov ◽  
O A Kananykhin ◽  
A V Fedorinov

Abstract The work is devoted to the analysis of the resolution chart image created with the Image Simulation mode of ZEMAX software. The changes in image quality are simulated using the model of Helios-44M-4 photographic objective lens. The research is conducted for monochromatic light conditions and computer simulated resolution test chart as an object for the lens with different chart positions. An axial beam and an off-axis beam that corresponds to the maximum object space field angle are analyzed. The calculation of contrast of the simulated resolution chart images is made modeling different spatial frequencies of the chart lines. The contrast is calculated in three ways. The first way uses the maximum and minimum values of the image illumination, and the second and third ways are based on the integral values of the illumination of black and white lines, calculated with the method of rectangles and the method of trapeziums, respectively. Having been calculated the values of contrast are compared with the theoretical values of the diffraction modulation transfer function obtained with ZEMAX.


Author(s):  
R.A. Ploc

The optic axis of an electron microscope objective lens is usually assumed to be straight and co-linear with the mechanical center. No reason exists to assume such perfection and, indeed, simple reasoning suggests that it is a complicated curve. A current centered objective lens with a non-linear optic axis when used in conjunction with other lenses, leads to serious image errors if the nature of the specimen is such as to produce intense inelastic scattering.


2015 ◽  
Author(s):  
S. D. Gunapala ◽  
S. B. Rafol ◽  
D. Z. Ting ◽  
A. Soibel ◽  
C. J. Hill ◽  
...  

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