Modeling and Simulation of VCSEL’s Turn-on Delay Based on Rate-Equations

2011 ◽  
Vol 110-116 ◽  
pp. 3364-3370
Author(s):  
Xin Zhi Shi ◽  
Chang Qi ◽  
Gao Feng Wang ◽  
Ji Cheng Hu ◽  
Feng Liu

Vertical-Cavity Surface-Emitting Lasers (VCSELs) are a new generation of semiconductor lasers that have many advantages. In this paper, we present a comprehensive circuit-level VCSEL model that addresses the spatial and thermal behavior of VCSELs including turn on delay based on the rate equations without sacrificing the numerical efficiency demanded by the circuit-level simulation of optoelectronic systems. It is implemented into SPICE-like simulators to simulate the dc, ac and transient features (including turn-on delay and turn-off effect) of VCSELs. The simulated results exhibit good agreements with references.

2016 ◽  
pp. 309-325
Author(s):  
N. Ledentsov Jr ◽  
V. A. Shchukin ◽  
N. N. Ledentsov ◽  
J.-R. Kropp ◽  
S. Burger ◽  
...  

2012 ◽  
Vol 1432 ◽  
Author(s):  
Robert W. Herrick

ABSTRACTVertical-Cavity Surface-Emitting Lasers are making up a large and growing share of the world’s production of semiconductor lasers. But the 850 nm GaAs quantum well VCSELs that make up most of present product are highly vulnerable to dislocation networks. In this paper, we discuss how materials selection affects the reliability of semiconductor lasers generally. We then describe the most common failure mechanisms observed in VCSELs, and what precautions are used to prevent them. We finish with a brief discussion of reliability testing and failure analysis.


2001 ◽  
Author(s):  
Bob Nagler ◽  
Jan Danckaert ◽  
Jan Albert ◽  
Michael Peeters ◽  
Krassimir P. Panajotov ◽  
...  

2013 ◽  
Vol 42 (3) ◽  
pp. 262-265
Author(s):  
彭金花 PENG Jin-hua ◽  
吴东升 WU Dong-sheng ◽  
徐荃 XU Quan ◽  
平兰兰 PING Lan-lan

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