Study of Electron Irradiation-Induced Defects of 3c-SiC and Diamond by Ultra-High Voltage Electron Microscopy

1995 ◽  
Vol 196-201 ◽  
pp. 1237-1242 ◽  
Author(s):  
Ryuichiro Oshima ◽  
Chou Y. Nie ◽  
Masao Komatsu ◽  
Hirotaro Mori
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Electron Irradiation ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Induced Defects ◽  
Irradiation Induced Defects ◽  
Ultra High Voltage

Radiation-Induced Precipitation at Thin Foil Surfaces in Ni-Be Alloys

1982 ◽  
Vol 40 ◽  
pp. 598-599
Author(s):  
T. Mukai ◽  
T. E. Mitchell
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Electron Irradiation ◽  
High Vacuum ◽  
Thin Foil ◽  
Homogeneous Precipitation ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Radiation Induced

Radiation-induced homogeneous precipitation in Ni-Be alloys was recently observed by high voltage electron microscopy. A coupling of interstitial flux with solute Be atoms is responsible for the precipitation. The present investigation further shows that precipitation is also induced at thin foil surfaces by electron irradiation under a high vacuum.

An autofocus method using quasi-Gaussian fitting of image sharpness in ultra-high-voltage electron microscopy

Microscopy ◽  
2013 ◽  
Vol 62 (5) ◽  
pp. 515-519 ◽  
Author(s):  
R. Nishi ◽  
Y. Moriyama ◽  
K. Yoshida ◽  
N. Kajimura ◽  
H. Mogaki ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Image Sharpness ◽  
High Voltage Electron Microscopy ◽  
Gaussian Fitting ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Ultra High Voltage
Sign in / Sign up

Export Citation Format

Share Document