Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry

2000 ◽  
Vol 338-342 ◽  
pp. 575-578 ◽  
Author(s):  
O.P. Alexander Lindquist ◽  
H. Arwin ◽  
Urban Forsberg ◽  
Peder Bergman ◽  
K. Järrendahl
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Angle Of Incidence ◽  
Variable Angle

Optical Characterization of Silicon Oxynitride Thin Films by Variable Angle Spectroscopic Ellipsometry

1992 ◽  
Vol 18 (2) ◽  
pp. 124-128 ◽  
Author(s):  
Yi-Ming Xiong ◽  
Paul G. Snyder ◽  
John A. Woollam ◽  
G. A. Al-Jumaily ◽  
F. J. Gagliardi ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Silicon Oxynitride ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

Optical characterization of hybrid PEDOT:PSS/Si heterostructures by spectroscopic ellipsometry

2021 ◽  
Vol 717 (1) ◽  
pp. 92-97
Author(s):  
O. S. Kondratenko ◽  
S. V. Mamykin ◽  
T. S. Lunko ◽  
I. B. Mamontova ◽  
V. R. Romanyuk
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Optical Characterization
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