Bending Damage Evolution and Its Influence on Critical Current and N-Value of Bi2223/Ag Superconducting Composite Tape

2005 ◽  
Vol 475-479 ◽  
pp. 933-936
Author(s):  
D. Doko ◽  
N. Miyazaki ◽  
Shojiro Ochiai ◽  
Hiroshi Okuda ◽  
Sang Soo Oh ◽  
...  
Keyword(s):  
Critical Current ◽  
Damage Evolution ◽  
Interfacial Debonding ◽  
The Other ◽  
N Value ◽  
Composite Tape ◽  
Bending Behavior ◽  
Superconducting Current

Bending behavior of Bi2223/Ag superconducting composite tapes, and the influence of the bending damages on critical superconducting current Ic and n-value that is a measure for the sharpness of the transition from super- to normal conduction, were studied. Following damages, responsible to the reduction in critical current at high bending strains, were observed. (i) Transverse and (ii) longitudinal crackings of the filaments, (iii) interfacial debonding between filaments and silver, and (iv) buckling in compression side. The damage of the filaments arose first locally, resulting in a reduction of the Ic and n-value in the corresponding local portion. The overall Ic and n-values were determined by such a local portion. With increasing strain, the damage of the other portions arose successively, resulting in loss of superconductivity in all portions.

Bending Damage Evolution and Its Influence on Critical Current and N-Value of Bi2223/Ag Superconducting Composite Tape

2005 ◽  
pp. 933-936
Author(s):  
D. Doko ◽  
N. Miyazaki ◽  
Shojiro Ochiai ◽  
Hiroshi Okuda ◽  
Sang Soo Oh ◽  
...  
Keyword(s):  
Critical Current ◽  
Damage Evolution ◽  
N Value ◽  
Composite Tape

scholarly journals Relation of n-value to critical current in bent-damaged Bi2223 composite tape

2012 ◽  
Vol 27 ◽  
pp. 264-267
Author(s):  
S. Ochiai ◽  
H. Okuda ◽  
M. Sugano ◽  
M. Hojo ◽  
K. Osamura ◽  
...  
Keyword(s):  
Critical Current ◽  
N Value ◽  
Composite Tape

Damage evolution under bending and tensile stress and its influence on critical current of Bi2223/Ag superconducting composite tape

2004 ◽  
Vol 329-333 ◽  
pp. 1585-1589 ◽  
Author(s):  
S Ochiai ◽  
N Miyazaki ◽  
D Doko ◽  
T Nagai ◽  
M Nakamura ◽  
...  
Keyword(s):  
Tensile Stress ◽  
Critical Current ◽  
Damage Evolution ◽  
Composite Tape

Modeling analysis of distribution of irreversible bending strain for critical current in Bi2223-composite tape

2008 ◽  
Vol 468 (15-20) ◽  
pp. 1796-1800 ◽  
Author(s):  
S. Ochiai ◽  
J.K. Shin ◽  
Y. Mukai ◽  
H. Matsubayashi ◽  
H. Okuda ◽  
...  
Keyword(s):  
Critical Current ◽  
Composite Tape ◽  
Bending Strain ◽  
Modeling Analysis

Critical current density and n-value of NbTi wires at low field

1995 ◽  
Vol 5 (2) ◽  
pp. 1201-1204 ◽  
Author(s):  
Y. Inoue ◽  
H. Kurahashi ◽  
Y. Fukumoto ◽  
M. Shimada
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
N Value ◽  
Low Field

Progress in inhomogeneity of critical current and index n value measurements on HTS tapes using contact-free method

2010 ◽  
Vol 53 (8) ◽  
pp. 2239-2246 ◽  
Author(s):  
YinShun Wang ◽  
XiaoJin Guan ◽  
HuiYuan Zhang ◽  
HongWei Liu
Keyword(s):  
Critical Current ◽  
N Value ◽  
Contact Free

Influence of Applied Tensile and Bending Strains on Local and Overall Critical Current of Multifilamentary Bi2223-Composite Superconductor

2007 ◽  
Vol 539-543 ◽  
pp. 739-744
Author(s):  
Shojiro Ochiai ◽  
D. Doko ◽  
Hiroshi Okuda ◽  
Sang Soo Oh ◽  
Dong Woo Ha ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Distribution Function ◽  
Weibull Distribution ◽  
Critical Current ◽  
Experimental Result ◽  
N Value ◽  
Local Current ◽  
Composite Superconductor ◽  
Extent Of Damage

Influence of applied tensile and bending strains on the local and overall transport critical current Ic and n-value at 77 K of multifilamentary Bi2223-composite superconductor was studied, where the n-value refers to the sharpness of the transition from super- to normal conducting state. Under both tensile and bending strains, the damage such as transverse and longitudinal cracking of the Bi2223 filaments and interfacial debonding between the filament and silver progressed. The extent of damage and accordingly the critical current was different among the local portions. The relation of the local current and n-value to overall ones was analyzed with a voltage summation model, with which the experimental result was described well. Further analysis revealed that the distribution of local critical current could be described by the Weibull distribution function and n-value could be expressed as a function of critical current. Based on these results, a Monte Carlo simulation was carried out to predict the overall critical current from the distribution of local critical current, with which the experimental results could be described.

Sign in / Sign up

Export Citation Format

Share Document