Ageing Studies of Plasma Deposited Organic Films by Surface Chemical Analysis (ESCA, ToF-SIMS, XAS)

2007 ◽  
Vol 539-543 ◽  
pp. 623-628 ◽  
Author(s):  
Wolfgang E.S. Unger ◽  
Umut Oran ◽  
Sufal Swaraj ◽  
Andreas Lippitz

The formation of plasma-polymerized materials made from organic molecules is a technologically attractive way to obtain films with unique properties for life science applications. Surface properties like bio-compatibility, wettability, etc., can be adjusted by tailoring the chemical functionalization. It is well known that after deposition these films undergo post-plasma reactions, especially when they are exposed to ambient atmosphere. Most often, in applications these films are not used immediately after their deposition – they are usually stored for a certain time. Therefore there is a need for a development of analytical procedures enabling studies of ageing phenomena of plasma chemically deposited films. With the help of these studies a better understanding of basic post-plasma reaction phenomena as well as relevant empiric information for practical applications can be obtained. However, a detailed chemical characterization of plasma chemically deposited films is a great challenge for the analysts because of the co-existence of a number of different chemical species. We investigated r.f. plasma-polymerized organic films by using photoelectron spectroscopy for chemical analysis (ESCA), spectroscopy of the near edge X-ray absorption fine structures (NEXAFS) and time-of-flight secondary ion mass spectroscopy (TOF-SIMS). Ethylene, styrene, allyl alcohol and allyl amine were used as monomers. A dedicated plasma preparation chamber was designed and added to the main analysis chamber of the respective spectrometer. This approach offers the possibility to study plasma-polymerized films in situ and, subsequently, the influence of post-plasma reactions. The important effect of air exposure of the film, in terms of plasma technology denominated as “ageing”, can be studied subsequentially step by step by this unique approach.

2011 ◽  
Vol 5 (3) ◽  
pp. 139-147 ◽  
Author(s):  
Francisco Moura ◽  
Alexandre Simões ◽  
Carla Riccardi ◽  
Maria Zaghete ◽  
Jose Varela ◽  
...  

The effect of annealing atmospheres (Atamb, N2 and O2) on the electrical properties of Ba(Ti0.90Zr0.10 )O3:2V (BZT10:2V) ceramics obtained by the mixed oxide method was investigated. X-ray photoelectron spectroscopy (XPS) analysis indicates that oxygen vacancies present near Zr and Ti ions reduce ferroelectric properties, especially in samples treated in an ambient atmosphere (Atamb ). BZT10:2V ceramics sintered in a nitrogen atmosphere showed better dielectric behaviour at room temperature with a dielectric permittivity measured at a frequency of 10 kHz equal to 16800 with dielectric loss of 0.023. Piezoelectric force microscopy (PFM) images reveal improvement in the piezoelectric coefficient by sintering the sample under nitrogen atmosphere. Thus, BZT10:2V ceramics sintered under a nitrogen atmosphere can be useful for practical applications which include nonvolatile digital memories, spintronics and data-storage media.


Author(s):  
D. R. Denley

Scanning tunneling microscopy (STM) has recently been introduced as a promising tool for analyzing surface atomic structure. We have used STM for its extremely high resolution (especially the direction normal to surfaces) and its ability for imaging in ambient atmosphere. We have examined surfaces of metals, semiconductors, and molecules deposited on these materials to achieve atomic resolution in favorable cases.When the high resolution capability is coupled with digital data acquisition, it is simple to get quantitative information on surface texture. This is illustrated for the measurement of surface roughness of evaporated gold films as a function of deposition temperature and annealing time in Figure 1. These results show a clear trend for which the roughness, as well as the experimental deviance of the roughness is found to be minimal for evaporation at 300°C. It is also possible to contrast different measures of roughness.


Sign in / Sign up

Export Citation Format

Share Document