Estimation of Self-Injection Length in Heterostructures of YBa2Cu3O7-δ Superconductor and La0.67Ca0.33MnO3 Manganite

2006 ◽  
Vol 111 ◽  
pp. 171-174
Author(s):  
S. Khatua ◽  
S. Wanchoo ◽  
T. Bannerjee ◽  
C.M. Thakar ◽  
S.K. Malik

Epitaxial bilayers of YBa2Cu3O7-δ (YBCO) and La0.67Ca0.33MnO3 (LCMO) heterostructures have been prepared by pulsed laser deposition technique, the growth sequence being YBCO on LCMO. The length scale of the YBCO layer, which is rendered non-superconductor/insulator by selfinjection of the spin polarized quasiparticles, is estimated to be 850Å. This can be an important guiding parameter in spintronic device configuration/fabrication.

2010 ◽  
Vol 197 (1-3) ◽  
pp. 129-134 ◽  
Author(s):  
J. J. Dolo ◽  
H. C. Swart ◽  
E. Coetsee ◽  
J. J. Terblans ◽  
O. M. Ntwaeaborwa ◽  
...  

1999 ◽  
Vol 574 ◽  
Author(s):  
D. Kumar ◽  
K. G. Cho ◽  
Zhang Chen ◽  
V. Craciun ◽  
P. H. Holloway ◽  
...  

AbstractThe growth, structural and cathodoluminescent (CL) properties of europium activated yttrium oxide (Eu:Y2O3) thin films are reported. The Eu:Y2O3 films were grown in-situ using a pulsed laser deposition technique. Our results show that Eu:Y2O3 films can grow epitaxially on (100) LaAlO3 substrates under optimized deposition parameters. The epitaxial growth of Eu:Y2O3 films on LaAlO3, which has a lattice mismatch of ∼ 60 %, is explained by matching of the atom positions in the lattices of the film and the substrate after a rotation. CL data from these films are consistent with highly crystalline Eu:Y2O3 films with an intense CL emission at 611 nm.


2010 ◽  
Vol 123-125 ◽  
pp. 375-378 ◽  
Author(s):  
Ram Prakash ◽  
Shalendra Kumar ◽  
Chan Gyu Lee ◽  
S.K. Sharma ◽  
Marcelo Knobel ◽  
...  

Ce1-xFexO2 (x=0, 0.01, 0.03 and 0.0 5) thin films were grown by pulsed laser deposition technique on Si and LaAlO3 (LAO) substrates. These films were deposited in vacuum and 200 mTorr oxygen partial pressure for both the substrates. These films were characterized by x-ray diffraction XRD and Raman spectroscopy measurements. XRD results reveal that these films are single phase. Raman results show F2g mode at ~466 cm-1 and defect peak at 489 cm-1 for film that deposited on LAO substrates, full width at half maximum (FWHM) is increasing with Fe doping for films deposited on both the substrates.


2014 ◽  
Vol 6 (20) ◽  
pp. 18205-18214 ◽  
Author(s):  
Zoran Jovanović ◽  
Matjaž Spreitzer ◽  
Janez Kovač ◽  
Dejan Klement ◽  
Danilo Suvorov

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