Determination of Crystallisation Parameters of a-Si from In Situ Conductance Measurements and Transmission Electron Microscopy Analysis

1994 ◽  
Vol 37-38 ◽  
pp. 311-316 ◽  
Author(s):  
T. Kretz ◽  
R. Stroh ◽  
P. Legagneux ◽  
O. Huet ◽  
M. Magis ◽  
...  
Nano Letters ◽  
2019 ◽  
Vol 19 (12) ◽  
pp. 8365-8371 ◽  
Author(s):  
Khalil El hajraoui ◽  
Eric Robin ◽  
Clemens Zeiner ◽  
Alois Lugstein ◽  
Stéphanie Kodjikian ◽  
...  

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