Preparation and characterization of manganese silicomolybdate for the adsorptive removal of Pb(II) and Fe (III) metal ions from aqueous medium: case study: Hesinia area, Egypt

2020 ◽  
Vol 193 ◽  
pp. 95-105
Author(s):  
Yousra H. Kotp ◽  
Mohamed E.A. Ali ◽  
Muhammad Gomaah ◽  
Hesham A. Ezzeldin
RSC Advances ◽  
2016 ◽  
Vol 6 (27) ◽  
pp. 22679-22689 ◽  
Author(s):  
Ayoub Abdullah Alqadami ◽  
Mu Naushad ◽  
Mohammad Abulhassan Abdalla ◽  
Tansir Ahamad ◽  
Zeid Abdullah Alothman ◽  
...  

A new magnetic adsorbent Fe3O4@TSC was used for the removal of Cr3+ and Co2+ metal ions from aqueous media.


Author(s):  
D. L. Callahan

Modern polishing, precision machining and microindentation techniques allow the processing and mechanical characterization of ceramics at nanometric scales and within entirely plastic deformation regimes. The mechanical response of most ceramics to such highly constrained contact is not predictable from macroscopic properties and the microstructural deformation patterns have proven difficult to characterize by the application of any individual technique. In this study, TEM techniques of contrast analysis and CBED are combined with stereographic analysis to construct a three-dimensional microstructure deformation map of the surface of a perfectly plastic microindentation on macroscopically brittle aluminum nitride.The bright field image in Figure 1 shows a lg Vickers microindentation contained within a single AlN grain far from any boundaries. High densities of dislocations are evident, particularly near facet edges but are not individually resolvable. The prominent bend contours also indicate the severity of plastic deformation. Figure 2 is a selected area diffraction pattern covering the entire indentation area.


2011 ◽  
Author(s):  
Giorgio Rocco Cavanna ◽  
Ernesto Caselgrandi ◽  
Elisa Corti ◽  
Alessandro Amato del Monte ◽  
Massimo Fervari ◽  
...  

Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.


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