scholarly journals STRUCTURAL ANALYSIS OF Li2O·14Nb2O5 BY COMBINED CONVERGENT-BEAM ELECTRON DIFFRACTION AND HIGH RESOLUTION ELECTRON MICROSCOPY

1984 ◽  
Vol 33 (11) ◽  
pp. 1581
Author(s):  
FENG GUO-GUANG ◽  
YANG CUI-YING ◽  
ZHOU YU-QING ◽  
TANG DI-SHENG
1981 ◽  
Vol 6 ◽  
Author(s):  
M. R. Pascucci ◽  
J. L. Hutchison ◽  
L. W. Hobbs

ABSTRACTThe metamict transformation under electron irradiation has been studied in α-quartz using transmission electron microscopy (TEM) and convergent-beam electron diffraction (CBD). The transformation occurs in two stages: heterogeneous nucleation of discrete disordered inclusions and a slower homogeneous loss of crystalline order in the surrounding matrix. Both features are attributable to solidstate radiolysis, a mechanism for which is proposed. Ultrahigh resolution TEM structure images and information from zeroth and high order Laue zones in CBD confirm that shortrange correlations are the first to be lost and that longerrange correlations persist well into the metamict transformation. A transformation model is advanced in which progressive disorder evolves from small displacements of individual [SiO4] coordination units, made possible by lowered connectivity, within a framework of long-range ordered material.


1987 ◽  
Vol 40 (4) ◽  
pp. 547 ◽  
Author(s):  
AF Moodie ◽  
HJ Whitfield

Combined high resolution electron microscopy and convergent beam electron diffraction (CBED) of the same areas of crystals of Ba3La3Cu6014 reveals defects of various types including ordinary dislocations and polytypic intergrowths. This latter type is considered to be intimately associated with the performance of this material as a high temperature superconductor ..


1992 ◽  
Vol 281 ◽  
Author(s):  
Y. R. Xing ◽  
C. J. Kiely ◽  
P. J. Goodhew

ABSTRACTChemical beam epitaxy (CBE) has been used to grow GaAs on silicon with a low defect density after etching in HF followed by a low temperature (600°C) in situ heat treatment. High resolution electron microscopy (HREM) and convergent beam electron diffraction (CBED) studies show the presence of 90° and 60° dislocations and some inversion domains.


Author(s):  
W. H. Wu ◽  
R. M. Glaeser

Spirillum serpens possesses a surface layer protein which exhibits a regular hexagonal packing of the morphological subunits. A morphological model of the structure of the protein has been proposed at a resolution of about 25 Å, in which the morphological unit might be described as having the appearance of a flared-out, hollow cylinder with six ÅspokesÅ at the flared end. In order to understand the detailed association of the macromolecules, it is necessary to do a high resolution structural analysis. Large, single layered arrays of the surface layer protein have been obtained for this purpose by means of extensive heating in high CaCl2, a procedure derived from that of Buckmire and Murray. Low dose, low temperature electron microscopy has been applied to the large arrays.As a first step, the samples were negatively stained with neutralized phosphotungstic acid, and the specimens were imaged at 40,000 magnification by use of a high resolution cold stage on a JE0L 100B. Low dose images were recorded with exposures of 7-9 electrons/Å2. The micrographs obtained (Fig. 1) were examined by use of optical diffraction (Fig. 2) to tell what areas were especially well ordered.


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