Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions

2016 ◽  
Vol 55 (4S) ◽  
pp. 04ED15 ◽  
Author(s):  
Yun Li ◽  
Hai Jiang ◽  
Zhiyuan Lun ◽  
Yijiao Wang ◽  
Peng Huang ◽  
...  
2005 ◽  
Vol 38 (23) ◽  
pp. 4202-4209 ◽  
Author(s):  
Zu-li Liu ◽  
Li Yu ◽  
Kai-lun Yao ◽  
Xing-bin Jing ◽  
Xing-ao Li ◽  
...  

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