statistical parameter extraction
Recently Published Documents

TOTAL DOCUMENTS

5

(FIVE YEARS 1)

H-INDEX

3

(FIVE YEARS 0)

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

CDF Distance Based Statistical Parameter Extraction Using Nonlinear Delay Variation Models

2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts52814.2021.9486684 ◽

2021 ◽

Author(s):

Kensuke Murakami ◽

Mahfuzul Islam ◽

Hidetoshi Onodera

Keyword(s):

Statistical Parameter ◽

Parameter Extraction ◽

Statistical Parameter Extraction ◽

Nonlinear Delay ◽

Delay Variation

Download Full-text

Impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices

Electronics Letters ◽

10.1049/el.2014.1837 ◽

2014 ◽

Vol 50 (19) ◽

pp. 1393-1395 ◽

Author(s):

E.G. Ioannidis ◽

C.G. Theodorou ◽

S. Haendler ◽

C.A. Dimitriadis ◽

G. Ghibaudo

Keyword(s):

Statistical Parameter ◽

Low Frequency ◽

Parameter Extraction ◽

Frequency Noise ◽

Low Frequency Noise ◽

Statistical Parameter Extraction ◽

Download Full-text

Statistical Parameter Extraction for Intra- and Inter-Chip Variabilities of Metal–Oxide–Semiconductor Field-Effect Transistor Characteristics

Japanese Journal of Applied Physics ◽

10.1143/jjap.44.131 ◽

2005 ◽

Vol 44 (1A) ◽

pp. 131-134 ◽

Author(s):

Kenichi Okada ◽

Hidetoshi Onodera

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistor ◽

Statistical Parameter ◽

Parameter Extraction ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Effect Transistor ◽

Statistical Parameter Extraction

Download Full-text

MOSFET statistical parameter extraction using multivariate statistics

Proceedings of the 1991 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1990.161743 ◽

2002 ◽

Author(s):

J.A. Power ◽

A. Mathewson ◽

W.A. Lane

Keyword(s):

Multivariate Statistics ◽

Statistical Parameter ◽

Parameter Extraction ◽

Statistical Parameter Extraction

Download Full-text

A novel methodology for statistical parameter extraction

Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) ◽

10.1109/iccad.1995.480205 ◽

2002 ◽

Author(s):

K. Krishna ◽

S.W. Director

Keyword(s):

Statistical Parameter ◽

Parameter Extraction ◽

Statistical Parameter Extraction

Download Full-text