test data compaction
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X-tolerant Test Data Compaction with Accelerated Shift Registers

Journal of Electronic Testing ◽

10.1007/s10836-009-5107-5 ◽

2009 ◽

Vol 25 (4-5) ◽

pp. 247-258 ◽

Cited By ~ 8

Author(s):

Martin Hilscher ◽

Michael Braun ◽

Michael Richter ◽

Andreas Leininger ◽

Michael Gössel

Keyword(s):

Test Data ◽

Data Compaction ◽

Test Data Compaction

Accelerated Shift Registers for X-tolerant Test Data Compaction

2008 13th European Test Symposium ◽

10.1109/ets.2008.38 ◽

2008 ◽

Cited By ~ 4

Author(s):

Martin Hilscher ◽

Michael Braun ◽

Michael Richter ◽

Andreas Leininger ◽

Michael Gossel

Keyword(s):

Test Data ◽

Data Compaction ◽

Test Data Compaction

An efficient test-data compaction for low power VLSI testing

2008 IEEE International Conference on Electro/Information Technology ◽

10.1109/eit.2008.4554304 ◽

2008 ◽

Author(s):

Po-Han Wu ◽

Tsung-Tang Chen ◽

Wei-Lin Li ◽

Jiann-Chyi Rau

Keyword(s):

Low Power ◽

Test Data ◽

Vlsi Testing ◽

Efficient Test ◽

Data Compaction ◽

Test Data Compaction

A Cost-effective Test Data Compaction Scheme

Proceedings of the IEEE Custom Integrated Circuits Conference ◽

10.1109/cicc.1992.591301 ◽

2005 ◽

Cited By ~ 2

Author(s):

E. Wu ◽

M.R. Moskowitz

Keyword(s):

Test Data ◽

Cost Effective ◽

Data Compaction ◽

Test Data Compaction

On test data compaction using linear cycle registers

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) ◽

10.1109/imtc.2004.1351397 ◽

2004 ◽

Author(s):

S. Demidenko ◽

E. Levine ◽

V. Piuri ◽

G. Sen Gupta

Keyword(s):

Test Data ◽

Data Compaction ◽

Test Data Compaction

Aliasing in multiple-valued test data compaction

[1992] Proceedings The Twenty-Second International Symposium on Multiple-Valued Logic ◽

10.1109/ismvl.1992.186776 ◽

2003 ◽

Cited By ~ 1

Author(s):

G. Edirisooriya ◽

J.P. Robinson

Keyword(s):

Test Data ◽

Data Compaction ◽

Test Data Compaction

test data compactionRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

X-tolerant Test Data Compaction with Accelerated Shift Registers

Accelerated Shift Registers for X-tolerant Test Data Compaction

An efficient test-data compaction for low power VLSI testing

A Cost-effective Test Data Compaction Scheme

On test data compaction using linear cycle registers

Aliasing in multiple-valued test data compaction

test data compaction
Recently Published Documents