Scanning Capacitance Microscopy Application for Bipolar and CMOS Doping Issues in Semiconductor Failure Analysis

Scanning Capacitance Microscopy (SCM) has been extensively used for identifying doping issues in semiconductor failure analysis. In this paper, the root causes of two recent problems -- bipolar beta loss and CMOS power leakage -- were verified using SCM images. Another localization method, layer-by-layer circuit repair with IROBIRCH detection, was also utilized to locate possible defects. The resulting failure mechanism for bipolar beta loss is illustrated with a schematic cross section, which shows the leakage path from the emitter to the base. In the case of CMOS power leakage, the abnormal implantation of the Pwell region was identified with the Plane view SCM image.

Amazon landforms and soils in relation to biological diversity

Thirteen main landform units are distinguished for the whole of the forested Amazon region, each with its specific soil pattern and vegetation structure. These landform-soil-vegetation units are delineated on a small-scale map and illustrated by a schematic cross-section. Floristic diversity of the gamma type is to be highest on the steepland-and-valley complexes of the Andean fringe, on the crystalline shield uplands, on the inselberg complexes, and on the eutric variant of the western sedimentary plains. Endemism is expected to be highest on the sandy plains, and parts of the table lands and inselberg complexes. Speciation, linked to the concept of forest refuge areas, is likely to be highest on the sandstone table lands, on the stretches of Amazon planalto, and in the areas of relict valleys, in view of the prolonged geomorphological stability of these units.