test response compaction Recently Published Documents

Compaction Method

Output bit selection methodology for test response compaction

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805873 ◽

2016 ◽

Author(s):

Wei-Cheng Lien ◽

Kuen-Jong Lee

Keyword(s):

Test Response ◽

Selection Methodology

Output-bit selection with X-avoidance using multiple counters for test-response compaction

2014 19th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2014.6847823 ◽

2014 ◽

Cited By ~ 2

Author(s):

Wei-Cheng Lien ◽

Kuen-Jong Lee ◽

Krishnendu Chakrabarty ◽

Tong-Yu Hsieh

Keyword(s):

Test Response ◽

Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test ◽

Output selection for test response compaction based on multiple counters

10.1109/vlsi-dat.2014.6834865 ◽

2014 ◽

Cited By ~ 2

Author(s):

Wei-Cheng Lien ◽

Kuen-Jong Lee ◽

Krishnendu Chakrabarty ◽

Tong-Yu Hsieh

Keyword(s):

Test Response ◽

Selection For

Counter-Based Output Selection for Test Response Compaction

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2012.2214479 ◽

2013 ◽

Vol 32 (1) ◽

pp. 152-164 ◽

Cited By ~ 5

Author(s):

Wei-Cheng Lien ◽

Kuen-Jong Lee ◽

Tong-Yu Hsieh ◽

Krishnendu Chakrabarty ◽

Yu-Hua Wu

Keyword(s):

Test Response ◽

Selection For

2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology ◽

Output bit selection for test response compaction based on a single counter

10.1109/icsict.2012.6467671 ◽

2012 ◽

Cited By ~ 1

Author(s):

Kuen-Jong Lee ◽

Wei-Cheng Lien ◽

Tong-Yu Hsieh

Keyword(s):

Test Response ◽

Selection For ◽

Single Counter

Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2181847 ◽

2012 ◽

Vol 31 (6) ◽

pp. 950-957 ◽

Cited By ~ 1

Author(s):

Thomas Rabenalt ◽

Michael Richter ◽

Frank Poehl ◽

Michael Goessel

Keyword(s):

Test Response ◽

Highly Efficient ◽

Efficient Test ◽

Accumulator-based output selection for test response compaction

2012 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.2012.6271757 ◽

2012 ◽

Cited By ~ 1

Author(s):

Wei-Cheng Lien ◽

Kuen-Jong Lee ◽

Tong-Yu Hsieh ◽

Shih-Shiun Chien ◽

Krishnendu Chakrabarty

Keyword(s):

Test Response ◽

Selection For

Test Response Compaction via Output Bit Selection

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2159116 ◽

2011 ◽

Vol 30 (10) ◽

pp. 1534-1544 ◽

Cited By ~ 16

Author(s):

Kuen-Jong Lee ◽

Wei-Cheng Lien ◽

Tong-Yu Hsieh

Keyword(s):

Test Response ◽

Artificial Intelligence and Applications / 718: Modelling, Identification, and Control ◽

Test Response Compaction in VLSI BIST with Array of Two-Input Linear Logic

10.2316/p.2011.718-048 ◽

2011 ◽

Author(s):

Sunil R. Das ◽

Alexander R. Applegate

Keyword(s):

Linear Logic ◽

Test Response ◽