2016 IEEE International Test Conference (ITC)
Latest Publications

TOTAL DOCUMENTS

70

(FIVE YEARS 0)

H-INDEX

9

(FIVE YEARS 0)

Published By IEEE

9781467387736

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Logic characterization vehicle design reflection via layout rewiring

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805849 ◽

2016 ◽

Author(s):

Phillip Fynan ◽

Zeye Liu ◽

Benjamin Niewenhuis ◽

Soumya Mittal ◽

Marcin Strajwas ◽

...

Keyword(s):

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Diagnostic resolution improvement through learning-guided physical failure analysis

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805824 ◽

2016 ◽

Author(s):

Carlston Lim ◽

Yang Xue ◽

Xin Li ◽

Ronald D. Blanton ◽

M. Enamul Amyeen

Keyword(s):

Failure Analysis ◽

Resolution Improvement ◽

Diagnostic Resolution

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Cross-layer system reliability assessment framework for hardware faults

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805863 ◽

2016 ◽

Author(s):

A. Vallero ◽

A. Savino ◽

G. Politano ◽

S. Di Carlo ◽

A. Chatzidimitriou ◽

...

Keyword(s):

System Reliability ◽

Reliability Assessment ◽

Cross Layer ◽

Assessment Framework ◽

Layer System ◽

Hardware Faults

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ITC technical paper evaluation and selection process

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805814 ◽

2016 ◽

Keyword(s):

Selection Process ◽

Technical Paper

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Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805867 ◽

2016 ◽

Author(s):

Anthony Coyette ◽

Baris Esen ◽

Wim Dobbelaere ◽

Ronny Vanhooren ◽

Georges Gielen

Keyword(s):

Integrated Circuits ◽

Interval Analysis ◽

Test Signal ◽

Signal Generation ◽

Circuit Partitioning ◽

Automatic Test ◽

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Using symbolic canceling to improve diagnosis from compacted response

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805823 ◽

2016 ◽

Author(s):

Kamran Saleem ◽

Nur A. Touba

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Recycled FPGA detection using exhaustive LUT path delay characterization

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805854 ◽

2016 ◽

Author(s):

Md Mahbub Alam ◽

Mark Tehranipoor ◽

Domenic Forte

Keyword(s):

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Automated measurement of defect tolerance in mixed-signal ICs

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805869 ◽

2016 ◽

Author(s):

Stephen Sunter ◽

Alessandro Valerio ◽

Riccardo Miglierina

Keyword(s):

Automated Measurement ◽

Defect Tolerance ◽

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Transformation of multiple fault models to a unified model for ATPG efficiency enhancement

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805866 ◽

2016 ◽

Author(s):

Cheng-Hung Wu ◽

Kuen-Jong Lee

Keyword(s):

Unified Model ◽

Fault Models ◽

Efficiency Enhancement ◽

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RF test accuracy and capacity enhancement on ATE for silicon TV tuners

2016 IEEE International Test Conference (ITC) ◽

10.1109/test.2016.7805842 ◽

2016 ◽

Author(s):

Y. Fan ◽

A. Verma ◽

Y. Su ◽

L. Rose ◽

J. Janney ◽

...

Keyword(s):

Test Accuracy ◽

Rf Test ◽

Capacity Enhancement

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