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2015 IEEE 33rd VLSI Test Symposium (VTS)
Latest Publications
TOTAL DOCUMENTS
71
(FIVE YEARS 0)
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9
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Published By IEEE
9781479975976
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ExTest scheduling for 2.5D system-on-chip integrated circuits
2015 IEEE 33rd VLSI Test Symposium (VTS)
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10.1109/vts.2015.7116266
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2015
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Cited By ~ 6
Author(s):
Ran Wang
◽
Guoliang Li
◽
Rui Li
◽
Jun Qian
◽
Krishnendu Chakrabarty
Keyword(s):
Integrated Circuits
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System On Chip
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On Chip
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Special session: Hot topics: Statistical test methods
2015 IEEE 33rd VLSI Test Symposium (VTS)
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10.1109/vts.2015.7116265
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2015
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Author(s):
Manuel J. Barragan
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Gildas Leger
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Florence Azais
◽
R. D. Blanton
◽
Adit D. Singh
◽
...
Keyword(s):
Test Methods
◽
Statistical Test
◽
Special Session
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[Copyright notice]
2015 IEEE 33rd VLSI Test Symposium (VTS)
◽
10.1109/vts.2015.7116237
◽
2015
◽
Keyword(s):
Copyright Notice
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In-depth soft error vulnerability analysis using synthetic benchmarks
2015 IEEE 33rd VLSI Test Symposium (VTS)
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10.1109/vts.2015.7116254
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2015
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Cited By ~ 5
Author(s):
Shahrzad Mirkhani
◽
Balavinayagam Samynathan
◽
Jacob A. Abraham
Keyword(s):
Vulnerability Analysis
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Soft Error
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Robust counterfeit PCB detection exploiting intrinsic trace impedance variations
2015 IEEE 33rd VLSI Test Symposium (VTS)
◽
10.1109/vts.2015.7116294
◽
2015
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Cited By ~ 17
Author(s):
Fengchao Zhang
◽
Andrew Hennessy
◽
Swarup Bhunia
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Testing of 3D-stacked ICs with hard- and soft-dies - a Particle Swarm Optimization based approach
2015 IEEE 33rd VLSI Test Symposium (VTS)
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10.1109/vts.2015.7116268
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2015
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Cited By ~ 3
Author(s):
Rajit Karmakar
◽
Aditya Agarwal
◽
Santanu Chattopadhyay
Keyword(s):
Particle Swarm Optimization
◽
Particle Swarm
◽
Swarm Optimization
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Special session 8C: E.J. McCluskey doctoral thesis award semi-final
2015 IEEE 33rd VLSI Test Symposium (VTS)
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10.1109/vts.2015.7116285
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2015
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Author(s):
M. Portolan
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K. Huang
Keyword(s):
Special Session
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Doctoral Thesis
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Low cost high frequency signal synthesis: Application to RF channel interference testing
2015 IEEE 33rd VLSI Test Symposium (VTS)
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10.1109/vts.2015.7116274
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2015
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Cited By ~ 1
Author(s):
Xian Wang
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Debashis Banerjee
◽
Abhijit Chatterjee
Keyword(s):
High Frequency
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Low Cost
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Frequency Signal
◽
High Frequency Signal
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Channel Interference
◽
Signal Synthesis
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VTS 2015 organizing committee
2015 IEEE 33rd VLSI Test Symposium (VTS)
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10.1109/vts.2015.7116239
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2015
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Download Full-text
Yield prognosis for fab-to-fab product migration
2015 IEEE 33rd VLSI Test Symposium (VTS)
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10.1109/vts.2015.7116261
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2015
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Cited By ~ 2
Author(s):
Ali Ahmadi
◽
Ke Huang
◽
Amit Nahar
◽
Bob Orr
◽
Michael Pas
◽
...
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